Device for monitoring the structure of a surface

Abstract

A device for structure monitoring of a surface to which the device can be applied, includes a carrier layer and a signal processing means, wherein the carrier layer is provided with electrical conductor paths, the signal processing means is electrically connected to the conductor paths for monitoring an electrical property of the conductor paths, the carrier layer to which the electrical conductor paths are applied is slotted, so that the carrier layer has openable cuts and the electrical conductor paths have openable contact points above it, so that when the cuts are closed the contact points are also closed and when the cuts are open the contact points are also open and thus the electrical conductor paths are reversibly interrupted, and the electrical property of the conductor paths monitored by the signal processing means is selected such that it has a different value for the case of closed contact points than for open contact points. In this way, a device for structure monitoring is provided which can be manufactured at low cost, can be used flexibly and can be reused.

Dependencies are inferred from the claim text.