Method and apparatus of determining point for processing workpiece
AssigneeABB Schweiz AG
InventorsWenzhou Yan, Tongshuai Zhu, Lun Jiang, Hao Chen, Xiaodi Yu
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Abstract
Methods and devices for determining a point for processing a workpiece. The methods include receiving an input representing an offset for adjusting a sample workpiece point, the sample workpiece point corresponding to a workpiece point for processing the workpiece, adjusting the sample workpiece point based on the input, so as to generate an adjusted sample workpiece point, and determining the workpiece point based on the adjusted sample workpiece point.
Claims12
A method of determining a point for processing a workpiece, comprising:
- receiving an input representing an offset for adjusting a sample workpiece point, the sample workpiece point corresponding to a workpiece point for processing the workpiece;
- adjusting the sample workpiece point based on the input, so as to generate an adjusted sample workpiece point;
- and
- determining the workpiece point based on the adjusted sample workpiece point.
An apparatus of determining a point for processing a workpiece, comprising:
- an input reception module configured to receive an input representing an offset for adjusting a sample workpiece point, the sample workpiece point corresponding to a workpiece point for processing the workpiece;
- an adjustment module configured to adjust the sample workpiece point based on the input, so as to generate an adjusted sample workpiece point;
- and
- a workpiece determination module configured to determine the workpiece point based on the adjusted sample workpiece point.
Dependencies are inferred from the claim text.