# US 2024/0201285 A1 · Systems and Methods for Analyzing Electrical Signals to Identify and Manage Stress Conditions, Risk States or Aging States Associated with Capacitors > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 2024/0201285 A1 - Document ID: US20240201285A1 - Status: Published application - Kind: A1 - Application number: 18/542,515 - Filed: 2023-12-15 - Published: 2024-06-20 - Earliest claimed: 2022-12-16 - Assignees: Schneider Electric USA, Inc. - Applicants: Schneider Electric USA, Inc. - Inventors: Johannes MENZEL; Clément Gaffet; Ravindra Narayan Kulkarni - Web page: https://patentgrep.com/patent/US20240201285A1 ## CPC - G01R 31/64: Testing of capacitors - G08B 21/18: Status alarms (G08B21/02 takes precedence) - G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12) - G08B: SIGNALLING SYSTEMS, e.g. PERSONAL CALLING SYSTEMS; ORDER TELEGRAPHS; ALARM SYSTEMS ## Abstract Systems and methods identify and manage stress conditions, risk states or aging states associated with capacitors associated with electrical equipment in an electrical power system. In one aspect, the systems and methods analyze electrical signals associated with the at least one capacitor and/or information from or derived from the electrical signals to identify possible stress conditions, risk states or aging states associated with the at least one capacitor and associated components. In response to identifying possible stress conditions, risk states or aging states, probable impacts of the possible stress conditions, risk states or aging states on the at least one capacitor and associated components may be determined. At least one action to monitor, warn a user or system, or alert a user or system, or to reduce or eliminate the possible stress conditions, risk states or aging states may be taken based, at least in part, on the determined impacts. ## Claims ### Claim 1 A method for identifying and managing stress conditions, risk state or aging state associated with at least one capacitor associated with an electrical device in an electrical power system, comprising: analyzing electrical signals associated the at least one capacitor and/or information derived from the electrical signals to identify a possible stress condition, risk state or aging state associated with the at least one capacitor and associated components; identifying a possible stress condition, risk state or aging state associated with the at least one capacitor and associated components based on the analysis; in response to identifying a possible stress condition, risk state or aging state, determining probable impacts of the possible stress condition, risk state or aging state on the at least one capacitor and associated components; and taking at least one action based on the determined impacts, the at least one action including to discard or record the identification, to inform a user or a system of the identification, or to reduce or eliminate the possible stress condition, risk state or aging state. ### Claim 2 (depends on 1) The method of claim 1, wherein the electrical signals are measured by at least one electrical signal measuring device. ### Claim 3 (depends on 2) The method of claim 2, wherein the at least one electrical signal measuring device is positioned proximate to the at least one capacitor for measuring the electrical signals. ### Claim 4 (depends on 2) The method of claim 2, wherein the at least one electrical signal measuring device is positioned remote from the at least one capacitor for measuring the electrical signals. ### Claim 5 (depends on 1) The method of claim 1, wherein the electrical signals are analyzed to identify at least one of predictive patterns and abnormalities, with the at least one of the predictive patterns and abnormalities being used to identify the possible stress condition, risk state or aging state trends and probable impacts. ### Claim 6 (depends on 1) The method of claim 1, wherein the electrical signals are analyzed for trends and steady state changes, including decreases in current over time, wherein the decreases in current over time are indicative of a possible stress condition, risk state or aging state. ### Claim 7 (depends on 1) The method of claim 1, wherein the electrical signals are analyzed for at least one of a duration, an increase, a decrease or a shape of current or voltage during energizing of the at least one capacitor, wherein the duration, the increase or decrease or shape of the current or voltage are indicative of a possible stress condition, risk state or aging state. ### Claim 8 (depends on 1) The method of claim 1, wherein the electrical signals are analyzed for an event start, wherein certain characteristics or features of the event start are indicative of a possible stress condition, risk state or aging state. ### Claim 9 (depends on 1) The method of claim 1, wherein the electrical signals are analyzed for an event end, wherein certain characteristics or features of the event end are indicative of a possible stress condition, risk state or aging state. ### Claim 10 (depends on 1) The method of claim 1, wherein the electrical signals are analyzed for an ongoing event, wherein certain characteristics or features of the ongoing event are indicative of a possible stress condition, risk state or aging state. ### Claim 11 (depends on 1) The method of claim 1, wherein the electrical signals are analyzed for harmonics, wherein fluctuations in the harmonics are indicative of a possible stress condition, risk state or aging state. ### Claim 12 (depends on 1) The method of claim 1, wherein the electrical signals are analyzed for occurrence of a breakdown event, wherein the occurrence of a breakdown event is indicative of a possible stress condition, risk state or aging state. ### Claim 13 (depends on 1) The method of claim 1, further comprising analyzing measured temperature(s) and/or pressure(s) associated with the at least one capacitor to identify a possible stress condition, risk state or aging state. ### Claim 14 (depends on 13) The method of claim 13, wherein the measured temperature(s) and/or pressure(s) is/are analyzed for increases over time, wherein the increases over time are indicative of a possible stress condition, risk state or aging state. ### Claim 15 (depends on 13) The method of claim 13, wherein the temperature(s) and/or pressure(s) is/are measured by at least one temperature or pressure sensing device proximate to the at least one capacitor. ### Claim 16 (depends on 1) The method of claim 1, wherein the at least one action further includes decoupling one or more capacitors of the at least one capacitor from an electrical system including the at least one capacitor. ### Claim 17 (depends on 1) The method of claim 1, wherein the at least one action further includes triggering at least one warning or alarm to indicate the possible stress condition, risk state or aging state. ### Claim 18 (depends on 1) The method of claim 1, wherein the at least one action further includes triggering at least one cooling device to reduce a temperature of the at least one capacitor. ### Claim 19 A system for identifying and managing stress conditions, risk state or aging state associated with at least one capacitor associated with electrical equipment in an electrical power system, comprising: at least one electrical signal measuring device configured to measure electrical signals associated with the at least one capacitor; and at least one processing device coupled to the at least one electrical signal measuring device, the at least one processing device configured to: analyze the electrical signals and/or information derived from the electrical signals to identify a possible stress condition, risk state or aging state associated with the at least one capacitor and associated components; identify a possible stress condition, risk state or aging state associated with the at least one capacitor and associated components based on the analysis; in response to identifying a possible stress condition, risk state or aging state, determine probable impacts of the possible stress condition, risk state or aging state on the at least one capacitor and associated components; and taking at least one action based on the determined impacts, the at least one action including to discard or record the identification, to inform a user or a system of the identification, or to reduce or eliminate the possible stress condition, risk state or aging state. ### Claim 20 (depends on 19) The system of claim 19, wherein the electrical signals are measured by at least one electrical signal measuring device. ### Claim 21 (depends on 20) The method of claim 20, wherein the at least one electrical signal measuring device is positioned proximate to the at least one capacitor for measuring the electrical signals. ### Claim 22 (depends on 20) The method of claim 20, wherein the at least one electrical signal measuring device is positioned remote from to the at least one capacitor for measuring the electrical signals. ### Claim 23 (depends on 19) The system of claim 19, wherein the electrical signals are analyzed to identify at least one of predictive patterns and abnormalities, with the at least one of the predictive patterns and abnormalities being used to identify the a possible stress condition, risk state or aging state trends and probable impacts. ### Claim 24 (depends on 19) The system of claim 19, wherein the electrical signals are analyzed for trends and steady state changes such as decreases in current over time, wherein the decreases in current over time are indicative of a possible stress condition, risk state or aging state. ### Claim 25 (depends on 19) The system of claim 19, wherein the electrical signals are analyzed for at least one of a duration, an increase, a decrease, or a shape of current or voltage during energizing of the at least one capacitor, wherein the duration, the increase, the decrease or the shape of the current or voltage are indicative of a possible stress condition, risk state or aging state. ### Claim 26 (depends on 19) The system of claim 19, wherein the electrical signals are analyzed for an event start, wherein certain characteristics or features of the event start are indicative of a possible stress condition, risk state or aging state. ### Claim 27 (depends on 19) The system of claim 19, wherein the electrical signals are analyzed for an event end, wherein certain characteristics or features of the event end are indicative of a possible stress condition, risk state or aging state. ### Claim 28 (depends on 19) The system of claim 19, wherein the electrical signals are analyzed for an ongoing event, wherein certain characteristics or features of the ongoing event are indicative of a possible stress condition, risk state or aging state. ### Claim 29 (depends on 19) The system of claim 19, wherein the electrical signals are analyzed for harmonics, wherein fluctuations in the harmonics are indicative of a possible stress condition, risk state or aging state. ### Claim 30 (depends on 19) The system of claim 19, wherein the electrical signals are analyzed for occurrence of a breakdown event, wherein the occurrence of a breakdown event is indicative of a possible stress condition, risk state or aging state. ### Claim 31 (depends on 19) The system of claim 19, further comprising at least one temperature and/or pressure sensing device proximate to the at least one capacitor and configured to measure temperature(s) and/or pressure(s) associated with the at least one capacitor, wherein the at least one processing device is further configured to analyze measured the temperature(s) and/or pressure(s) associated with the at least one capacitor to identify the possible stress condition, risk state or aging state. ### Claim 32 (depends on 31) The system of claim 31, wherein the measured temperature(s) and/or pressure(s) is/are analyzed for increases over time, wherein the increases over time are indicative of a possible stress condition, risk state or aging state. ### Claim 33 (depends on 19) The system of claim 19, further comprising: at least one control device coupled to the at least one processing device and the at least one capacitor, the at least one control device configured to: receive at least one control signal from the processing device in response to the at least one processing device identifying the possible stress condition, risk state or aging state; and take at least one action to warn or alert a user or a system, or to reduce or eliminate the possible stress condition, risk state or aging state in response to receiving the at least one control signal. ### Claim 34 (depends on 33) The system of claim 33, wherein the at least one action further includes decoupling one or more capacitors of the at least one capacitor from an electrical system including the at least one capacitor. ### Claim 35 (depends on 33) The system of claim 33, wherein the at least one action further includes triggering at least one alarm to indicate the possible stress condition, risk state or aging state. ### Claim 36 (depends on 33) The system of claim 33, wherein the at least one action further includes triggering at least one cooling device to reduce a temperature of the at least one capacitor in response to receiving the control signal. ### Claim 37 (depends on 1) A computer-readable medium storing computer-readable instructions for causing a processing device to perform a method according to claim 1.