# US 2024/0201241 A1 · Measurement arrangement, measurement setup, measurement system and method for determining a beamforming characteristic of a device under test

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- Number: US 2024/0201241 A1
- Document ID: US20240201241A1
- Status: Published application
- Kind: A1
- Application number: 18/589,333
- Filed: 2024-02-27
- Published: 2024-06-20
- Earliest claimed: 2021-08-27
- Applicants: Advantest Corporation
- Inventors: José MOREIRA; Max NEUWEILER; Jochen ZAISER; Arimoto KIKUCHI
- Web page: https://patentgrep.com/patent/US20240201241A1

## CPC

- G01R 29/0871: {Complete apparatus or systems; circuits, e.g. receivers or amplifiers (G01R29/0878, G01R29/0892 take precedence; dosimeters, warning devices G01R29/0857)}
- H04B 7/0617: {for beam forming}
- G01R 29/10: Radiation diagrams of antennas
- G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12)
- H04B: TRANSMISSION

## Abstract

Embodiments according to the disclosure have a measurement arrangement for an automated test equipment (ATE), for determining a beamforming characteristic of a device under test (DUT), wherein the measurement arrangement is adapted to carry an antenna and wherein the measurement arrangement is configured to manipulate position of the antenna relative to the DUT, to allow for a determination of the beamforming characteristic of the DUT when the DUT is coupled to a load board, and when the load board is electrically coupled to a test head of the ATE. Furthermore, the measurement arrangement is configured to be attached to the test head of the ATE or to a load board frame attached to the test head of the ATE.

## Claims

### Claim 1

A measurement arrangement for an automated test equipment (ATE), for determining a beamforming characteristic of a device under test (DUT),
wherein the measurement arrangement is adapted to carry an antenna, and
wherein the measurement arrangement is configured to manipulate a position of the antenna, relative to the DUT, to allow for a determination of the beamforming characteristic of the DUT when the DUT is coupled to a load board, and when the load board is electrically coupled to a test head of the ATE; and
wherein the measurement arrangement is configured to be attached to the test head of the ATE or to a load board frame attached to the test head of the ATE.

### Claim 2 (depends on 1)

The measurement arrangement according to claim 1, wherein the measurement arrangement is configured to be attached to the test head or the load board frame attached to the test head, when the load board is already electrically coupled to the test head and/or when the load board is already attached to the load board frame.

### Claim 3 (depends on 1)

The measurement arrangement according to claim 1, wherein the measurement arrangement is configured to be supported mechanically by the test head or by the load board frame attached to the test head.

### Claim 4 (depends on 1)

The measurement arrangement according to claim 1, wherein the measurement arrangement is configured to manipulate an elevation and/or an azimuth of the antenna, relative to a DUT position, in order to manipulate the position of the antenna.

### Claim 5 (depends on 1)

The measurement arrangement according to claim 1, wherein the measurement arrangement comprises a central part; and
wherein the measurement arrangement comprises, in the central part, an opening for the load board frame, wherein the central part is configured to be attached to the load board frame.

### Claim 6 (depends on 5)

The measurement arrangement according to claim 5, wherein the measurement arrangement comprises
a ring structure around the central part, wherein the ring structure is configured to be rotatable around the central part, and
a first rotary joint, and
a carrier structure, wherein the carrier structure is attached to the first rotary joint and wherein the carrier structure is adapted to carry the antenna, and wherein the first rotary joint is configured to allow for a manipulation of an elevation of the carrier structure relative to the central part via a rotation of the carrier structure.

### Claim 7 (depends on 5)

The measurement arrangement according to claim 5, wherein the opening for the load board frame is formed, such that the measurement arrangement can be attached to and/or removed from the test head, while the load board is attached to the load board frame which is attached to the test head.

### Claim 8 (depends on 7)

The measurement arrangement according to claim 7, wherein the measurement arrangement comprises the first rotary joint and a second rotary joint, wherein the rotary joints are attached to opposite sides of the ring structure; and
wherein the first and second rotary joints are arranged, such that they comprise a common rotation axis, wherein the rotation axis and a normal vector of the plane of the central part and/or of the plane of the ring structure are orthogonal, with a tolerance of less than 0.01°, less than 0.1° or less than 1° or less than 5°; and
wherein the carrier structure is attached to the first and the second rotary joint; and
wherein the first and second rotary joints are configured to allow for a manipulation of an elevation of the carrier structure, relative to the central part, via a rotation of the carrier structure around the common rotation axis of the first and second rotary joint.

### Claim 9 (depends on 6)

The measurement arrangement according to claim 6, wherein the measurement arrangement is configured to center the antenna, when attached to the carrier structure, over the DUT,
when the DUT is coupled to the load board, and
when the measurement arrangement and the load board are attached to the load board frame, the load board frame being attached to the test head, and when the carrier structure is rotated to a position wherein an elevation between the carrier structure and the load board is 90 degrees.

### Claim 10 (depends on 6)

The measurement arrangement according to claim 6, wherein the ring structure comprises a plurality of bearing elements; and wherein the ring structure is supported by the central part via the bearing elements, such that the ring structure can rotate around the central part.

### Claim 11 (depends on 1)

The measurement arrangement according to claim 1, wherein the measurement arrangement comprises an absorptive structure and wherein the absorptive structure is configured to absorb electromagnetic waves.

### Claim 12 (depends on 1)

The measurement arrangement according to claim 1, wherein the measurement arrangement comprises a calibration reference antenna, wherein the calibration reference antenna is configured to provide a reference signal for a calibration of the measurement antenna.

### Claim 13 (depends on 1)

A measurement setup comprising
a measurement arrangement according to claim 1; and
the load board frame, wherein the load board frame is configured to be coupled with the load board; and
wherein the load board frame is configured to be attached to the test head; and
wherein the measurement arrangement is configured to be attached to the load board frame.

### Claim 14 (depends on 13)

The measurement setup according to claim 13, wherein the load board frame is configured to provide for a spacing between the test head and the load board; and
wherein the load board frame is configured to allow for a routing of one or more cables for feeding signals from the test head to the load board, and/or to allow for a routing of one or more cables for guiding signals from the load board to the test head and/or to allow for a routing of one or more cables from the test head to the measurement arrangement and/or to allow for a storing of additional components in the spacing.

### Claim 15 (depends on 13)

A measurement system comprising:
a test head;
a load board; and
a measurement setup according to claim 13;
wherein the load board frame is attached to the test head; and
wherein the load board is mechanically coupled to the load board frame.

### Claim 16 (depends on 15)

The measurement system according to claim 15, wherein the measurement arrangement is configured to be controlled by the test head, and wherein the measurement arrangement is configured to manipulate the position of the antenna and/or to provide a measurement information for determining the beamforming characteristic of the DUT, in response to a control signal provided by the test head.

### Claim 17 (depends on 15)

The measurement system according to claim 15, wherein the measurement arrangement comprises one or more control modules; and
wherein the one or more control modules are configured to control the actuator; and/or
wherein the antenna is configured to provide a plurality of measurement signals, and
wherein the one or more control modules are configured to control a selection of a measurement signal of the plurality of measurement signals of the antenna.

### Claim 18 (depends on 15)

The measurement system according to claim 15,
wherein the test head is configured to test a plurality of DUTs, when the DUTs are electrically coupled to the load board;
wherein the test head is configured to perform a plurality of tests on the plurality of DUTs; and
wherein the test head is configured to perform one or more tests of the plurality of tests temporally in parallel on a plurality of devices under test.

### Claim 19 (depends on 18)

The measurement system according to claim 18, wherein the test head is configured to provide a test signal for determining a beamforming characteristic of a DUT, temporally parallel to a testing of one or more DUTs.

### Claim 20

A method for determining a beamforming characteristic of a device under test (DUT), using an automated test equipment (ATE) and a measurement arrangement, the method comprising:
manipulating a position of an antenna, carried by the measurement arrangement, relative to the DUT,
while the DUT is coupled to a load board, and while the load board is electrically coupled to a test head of the ATE, and
wherein the measurement arrangement is attached to the test head of the ATE or to a load board frame attached to the test head of the ATE; and
determining the beamforming characteristic of the device under test (DUT).
