# US 2024/0201076 A1 · Lighting assembly and method for providing measuring light and optical measuring device

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- Number: US 2024/0201076 A1
- Document ID: US20240201076A1
- Status: Published application
- Kind: A1
- Application number: 18/555,717
- Filed: 2022-04-11
- Published: 2024-06-20
- Earliest claimed: 2021-04-19
- Assignees: LMI Technologies Inc.
- Applicants: Lmi Technologies Inc.
- Inventors: Heimo KERÄNEN
- Web page: https://patentgrep.com/patent/US20240201076A1

## CPC

- G01N 21/31: Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry {(G01N21/72 takes precedence)}
- C09K 11/00: Luminescent materials, e.g. electroluminescent or chemiluminescent
- F21V 13/08: the elements being filters or photoluminescent elements and reflectors
- G01J 3/10: Arrangements of light sources specially adapted for spectrometry or colorimetry
- G01J 3/46: Measurement of colour; Colour measuring devices, e.g. colorimeters (measuring colour temperature G01J5/60)
- G02B 5/00: Optical elements other than lenses (light guides G02B6/00; optical logic elements G02F3/00)
- G02B 21/0024: {Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders}
- G02B 21/0032: {Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers (G02B21/0036 - G02B21/008; means for illumination of specimens in general G02B21/06)}
- G03B 21/204: {using secondary light emission, e.g. luminescence or fluorescence (using different colours G03B33/00; if related to video signals H04N9/3197)}
- G01B 11/00: Measuring arrangements characterised by the use of optical techniques
- G01B 11/0608: {Height gauges}
- G01B 2210/50: Using chromatic effects to achieve wavelength-dependent depth resolution
- G01J 3/42: Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry (beam switching arrangements G01J3/08)
- G01J 2003/425: {Reflectance}
- G01N 21/17: Systems in which incident light is modified in accordance with the properties of the material investigated (where the material investigated is optically excited causing a change in wavelength of the incident light G01N21/63)
- G01N 2201/061: Sources
- G01N 2201/068: Optics, miscellaneous
- G02B 27/40: Optical focusing aids
- G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing apparatus or processes other than immunoassay, involving enzymes or microorganisms C12M, C12Q)
- C09K: MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- F21V: FUNCTIONAL FEATURES OR DETAILS OF LIGHTING DEVICES OR SYSTEMS THEREOF; STRUCTURAL COMBINATIONS OF LIGHTING DEVICES WITH OTHER ARTICLES, NOT OTHERWISE PROVIDED FOR
- G01J: MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY (light sources F21, H01J, H01K, H05B; investigating properties of materials by optical means G01N)
- G02B: OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G03B: APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR (optical parts of such apparatus G02B; photosensitive materials or processes for photographic purposes G03C; apparatus for processing exposed photographic materials G03D)
- G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS

## Abstract

Presented herein is a lighting assembly for providing polychromatic measuring light (230) for an optical measuring device. The lighting assembly comprises an aperture component (202) comprising a first and opposite second side and at least one orifice (204), at least one pump light source (206) located on the first side of the aperture component (202) to provide pump light (220). and photoluminescent component (208) located on the second side of the aperture component (202) for converting pump light (220) receivable onto the photoluminescent component (208) from the at least one pump light source (206) into polychromatic measuring light (230). At least part of the measuring light (230) is allowed to pass the aperture component (202) through the at least one orifice (204) to provide measuring light (230) to the first side of the aperture component (202). A related method and a measuring devise using the lighting assembly are also presented.

## Claims

### Claim at position 1

1-18. (canceled)

### Claim 19

A chromatic confocal measuring device for determining one or more properties of a surface of an object, the measuring device comprising a lighting assembly, which comprises:
an aperture component comprising a first and opposite second side and at least one orifice;
at least one pump light source to provide pump light; and
photoluminescent component located on the second side of the aperture component for converting pump light receivable onto the photoluminescent component from the at least one pump light source into polychromatic measuring light,
wherein part of the measuring light is allowed to pass the aperture component through the at least one orifice to provide measuring light to the first side of the aperture component,
wherein the pump light source being located on the first side of the aperture component.

### Claim 20 (depends on 19)

The chromatic confocal measuring device lighting assembly of claim 19, wherein the pump light and the measuring light are allowed to pass through the same the at least one orifice of the aperture component.

### Claim 21 (depends on 19)

The chromatic confocal measuring device of claim 19, wherein the material of the aperture component is transparent for the pump light and nontransparent for the measuring light.

### Claim 22 (depends on 19)

The chromatic confocal measuring device of claim 19, wherein the second side of the aperture component is at least partially reflectable for the pump light and/or the measuring light.

### Claim 23 (depends on 19)

The chromatic confocal measuring device of claim 19, wherein the lighting assembly further comprises a substrate component attached to a side of the photoluminescent component opposite to another side of the photoluminescent component towards the second side of the aperture component.

### Claim 24 (depends on 23)

The chromatic confocal measuring device of claim 23, wherein the aperture component, the photoluminescent component and the substrate component are attached to each other forming a multilayer structure such that the photoluminescent component is at least partially sandwiched between the substrate component and the aperture component.

### Claim 25 (depends on 19)

The chromatic confocal measuring device of claim 19, wherein the assembly further comprises an optical connecting component disposed on the first side of the aperture component such that the pump light is inputtable via the connecting component to the at least one orifice.

### Claim 26 (depends on 25)

The chromatic confocal measuring device of claim 25, wherein the connecting component is a beam splitter or dichroic filter, wherein the measuring light is allowed to pass through the connection component.

### Claim 27 (depends on 25)

The chromatic confocal measuring device of claim 25, wherein the connection component is a mirror or optical fiber.

### Claim 28 (depends on 19)

The chromatic confocal measuring device of claim 19, wherein the aperture component comprises a masking layer on the photoluminescent component.

### Claim 29 (depends on 19)

The chromatic confocal measuring device of claim 19, the lighting assembly further comprises an optically transmissive substrate located on the first side of the aperture component, wherein the aperture component comprises a masking layer on a side of the transmissive substrate towards the luminescent component.

### Claim 30 (depends on 19)

The chromatic confocal measuring device of claim 19, wherein:
the optical measuring device comprises imaging optics;
the pump light source, connecting component and the imaging optics are disposed in relation to the at least one orifice such that the pump light is inputtable via the connection component through the imaging optics and is focusable through the imaging optics to the at least one orifice and such that the measuring light passed through the at least one orifice is collectable by the imaging optics.

### Claim 31 (depends on 19)

The chromatic confocal measuring device of claim 19, wherein the optical measuring device is a spectroscopic measuring device for determining transmission or reflectance spectrum of the object or the colour of the surface of the object.

### Claim 32 (depends on 19)

The chromatic confocal measuring device of claim 19 wherein the at least one orifice comprises a slit-shaped orifice or a plurality of punctiform orifices.

### Claim 33 (depends on 28)

The chromatic confocal measuring device of claim 28 wherein the masking layer is a masking metal film layer produced by deposition.

### Claim 34 (depends on 29)

The chromatic confocal measuring device of claim 29 wherein the masking, layer comprises a masking metal film layer produced by deposition.

### Claim 35

A method for providing measuring light for a chromatic confocal measuring device for determining of one or more properties of a surface of the object, comprising:
directing pump light onto a photoluminescent component locating on the second side of the aperture component, the pump light being directed from a first side to a second side of the aperture component;
converting the pump light in the luminescent component into polychromatic measuring light; and
providing measuring light to the first side of the aperture component by allowing the measuring light pass the aperture component through at least one orifice.

### Claim 36 (depends on 35)

The method of claim 35 wherein the at least one orifice comprises a slit-shaped orifice or a plurality of punctiform orifices.
