# US 2024/0201012 A1 · Characteristic value correction device, characteristic value calculation device, inspection device including the same, characteristic value correction method, light-emitting device, and characteristic value correction program > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 2024/0201012 A1 - Document ID: US20240201012A1 - Status: Published application - Kind: A1 - Application number: 18/536,168 - Filed: 2023-12-11 - Published: 2024-06-20 - Earliest claimed: 2022-12-16 - Assignees: Nichia Corporation - Applicants: Nichia Corporation - Inventors: Yoshiki YAMAJI - Web page: https://patentgrep.com/patent/US20240201012A1 ## CPC - G01J 1/4257: {applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam (monitoring arrangements for lasers in general H01S3/0014)} - G01J 1/20: intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle - H05B 45/14: using electrical feedback from LEDs or from LED modules - G01J: MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY (light sources F21, H01J, H01K, H05B; investigating properties of materials by optical means G01N) - H05B: ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL ## Abstract A characteristic value correction device includes a waveform acquiring unit, an area calculating unit, a time calculating unit, and a correction coefficient calculating unit. The waveform acquiring unit is configured to acquire a waveform indicating a relationship between an elapsed time and a first current value obtained when the pulse current is applied to a light-emitting device. The area calculating unit is configured to calculate a first area of an entire waveform and a second area of a rectangular wave portion. The time calculating unit is configured to calculate a first time between an application start time and an application end time of the pulse current and a second time corresponding to the second area. The correction coefficient calculating unit is configured to obtain a correction coefficient based on a ratio between the first area and the second area and a ratio between the first time and the second time. ## Claims ### Claim 1 A characteristic value correction device for correcting a characteristic value of a light-emitting device using a first current value actually flowing through the light-emitting device when a pulse current is applied to the light-emitting device to inspect a characteristic of the light-emitting device in an inspection device that inspects the characteristic of the light-emitting device, the characteristic value correction device comprising: a waveform acquiring unit configured to acquire a waveform indicating a relationship between an elapsed time and the first current value obtained when the pulse current is applied to the light-emitting device; an area calculating unit configured to calculate a first area of an entire waveform acquired in the waveform acquiring unit and a second area of a rectangular wave portion where the first current value is stable in the waveform; a time calculating unit configured to calculate a first time between an application start time and an application end time of the pulse current of the entire waveform and a second time corresponding to the second area; and a correction coefficient calculating unit configured to obtain a correction coefficient based on a ratio between the first area and the second area calculated in the area calculating unit and a ratio between the first time and the second time calculated in the time calculating unit. ### Claim 2 (depends on 1) The characteristic value correction device according to claim 1, wherein the area calculating unit is configured to set a point in time at which an amount of change per unit time becomes substantially 0 as a start point of the rectangular wave portion corresponding to the second area. ### Claim 3 (depends on 1) The characteristic value correction device according to claim 1, wherein the area calculating unit is configured to set an end point of the rectangular wave portion corresponding to the second area in accordance with the application end time of the pulse current. ### Claim 4 (depends on 1) The characteristic value correction device according to claim 1, wherein the correction coefficient K is represented by the following relational expression (1): Correction coefficient K=(second area/first area)×(first time/second time) (1). ### Claim 5 A characteristic value calculation device for calculating a characteristic value of a light-emitting device using a first current value actually flowing through the light-emitting device when a pulse current is applied to the light-emitting device to inspect a characteristic of the light-emitting device in an inspection device that inspects the characteristic of the light-emitting device, the characteristic value calculation device comprising: a waveform acquiring unit configured to acquire a waveform indicating a relationship between an elapsed time and the first current value obtained when the pulse current is applied to the light-emitting device; a graph replacement processing unit configured to replace the waveform acquired in the waveform acquiring unit with a graph of a rectangular wave indicating a relationship between an elapsed time and the characteristic value based on a relationship between a current value flowing through the light-emitting device and the characteristic value; and a characteristic value calculating unit configured to integrate the graph of the rectangular wave to calculate the characteristic value of the light-emitting device. ### Claim 6 (depends on 5) The characteristic value calculation device according to claim 5, wherein the characteristic value represents brightness of light emitted from the light-emitting device. ### Claim 7 (depends on 1) An inspection device comprising: the characteristic value correction device according to claim 1; a measurement device configured to measure a first measurement value of the characteristic of the light-emitting device; and a characteristic converting unit configured to calculate a second measurement value by multiplying the first measurement value obtained by the measurement device by the correction coefficient obtained by the characteristic value correction device. ### Claim 8 A characteristic value correction method for correcting a characteristic value of a light-emitting device using a first current value actually flowing through the light-emitting device when a pulse current is applied to the light-emitting device to inspect a characteristic of the light-emitting device in an inspection device that inspects the characteristic of the light-emitting device, the characteristic value correction method comprising: acquiring a waveform indicating a relationship between an elapsed time and the first current value obtained when the pulse current is applied to the light-emitting device; calculating a first area of an entire waveform acquired in the acquiring of the waveform and a second area of a rectangular wave portion where the first current value is stable in the waveform; calculating a first time between an application start time and an application end time of the pulse current of the entire waveform and a second time corresponding to the second area; and obtaining a correction coefficient based on a ratio between the first area and the second area and a ratio between the first time and the second time. ### Claim 9 (depends on 8) A light-emitting device inspected using a characteristic value corrected by the characteristic value correction method according to claim 8. ### Claim 10 A non-transitory computer-readable medium having stored thereon a characteristic value correction program for correcting a characteristic value of a light-emitting device using a first current value actually flowing through the light-emitting device when a pulse current is applied to the light-emitting device to inspect a characteristic of the light-emitting device in an inspection device that inspects the characteristic of the light-emitting device, the characteristic value correction program causing a computer to execute a characteristic value correction method comprising: acquiring a waveform indicating a relationship between an elapsed time and the first current value obtained when the pulse current is applied to the light-emitting device; calculating a first area of the entire waveform acquired in the acquiring of the waveform and a second area of a rectangular wave portion where the first current value is stable in the waveform; calculating a first time between an application start time and an application end time of the pulse current of the entire waveform and a second time corresponding to the second area; and obtaining a correction coefficient based on a ratio between the first area and the second area and a ratio between the first time and the second time.