Multilayer substrate manufacturing method and wiring substrate
AssigneeMitsui Mining & Smelting Co., Ltd.
InventorsYukiko KITABATAKE, Mikiko KOMIYA, Yoshinori MATSUURA
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AssigneeMitsui Mining & Smelting Co., Ltd.
InventorsYukiko KITABATAKE, Mikiko KOMIYA, Yoshinori MATSUURA
Estimating the term…
Provided is a method for manufacturing a multilayer substrate capable of suppressing short circuits between bumps and the warpage of substrates. This method includes: providing a first substrate being a rigid substrate including first bumps, and a second substrate or semiconductor device including second bumps, the first bumps and the second bumps being composed of a metal or alloy having a melting point of 600° C. or more, and having a height of 0.3 μm or more; performing cleaning treatment on bonding surfaces of the first bumps and the second bumps under a pressure of 1×10−3 Pa or less, and subsequently stacking the first substrate and the second substrate or semiconductor device so that the bonding surfaces of the first bumps and the second bumps abut each other, and pressure-welding the first bumps and the second bumps at a temperature of 90° C. or less to form a multilayer substrate.
A method for manufacturing a multilayer substrate, comprising:
A wiring substrate comprising:
Dependencies are inferred from the claim text.