Method and Apparatus for Automatic Exposure
AssigneeTexas Instruments Incorporated
InventorsGunawath Dilshan Godaliyadda, Mayank Mangla, Gang Hua
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Abstract
A method for automatic exposure (AE) control is provided that includes receiving statistics for AE control for an image from an image signal processor (ISP) coupled to an image sensor generating the image, computing an exposure value at a current time t (EV(t)) using a cost function based on target characteristics of an image, wherein computation of the cost function uses the statistics, and computing AE settings for the image sensor based on EV(t).
Claims20
A non-transitory computer readable medium storing software instructions that, when executed by at least one processor, cause the at least one processor to:
- receive statistics associated with automatic exposure (AE) control of an imaging sensor system;
- determine an exposure value using a cost function based on the statistics, wherein the cost function includes one or more weights predetermined using a learning process based on a plurality of images corresponding to different exposure values;
- and
- determine AE settings for the imaging sensor system based on the determined exposure value.
A system, comprising:
- memory configured to store software instructions;
- and
- at least one processor configured to execute the software instructions to:
- receive parameters of a cost function associated with automatic exposure (AE) control of an imaging sensor system, wherein the parameters comprises a range of candidate weight values and a set of starting exposure values;
- perform an iterative operation to determine one or more weights of the cost function based on differing combinations of candidate sets of weight values selected from the range of candidate weight values and starting exposure values selected from the set of starting exposure values, wherein an individual step of the iterative operation comprises determining exposure values for a plurality of images captured by the imaging sensor system based on a candidate set of weight values and a starting exposure value;
- and
- determine a quality metric for each candidate set of weight values based on the exposure values determined from the iterative operation.
A method, comprising:
- receiving parameters of a cost function associated with automatic exposure (AE) control of an imaging sensor system, wherein the parameters comprises a range of candidate weight values and a set of starting exposure values;
- performing an iterative operation to determine one or more weights of the cost function based on differing combinations of candidate sets of weight values selected from the range of candidate weight values and starting exposure values selected from the set of starting exposure values, wherein an individual step of the iterative operation comprises determining exposure values for a plurality of images captured by the imaging sensor system based on a candidate set of weight values and a starting exposure value;
- and
- determining a quality metric for each candidate set of weight values based on the exposure values determined from the iterative operation.
Dependencies are inferred from the claim text.