Method for manufacturing a semiconductor device

Abstract

A method for manufacturing a semiconductor device including a first semiconductor zone optimised for electron conduction and a second semiconductor zone optimised for hole conduction, the method including providing a multilayer structure including a substrate and a silicon-germanium layer disposed on the substrate; defining in the multilayer structure a first region for containing the first semiconductor zone and a second region for containing the second semiconductor zone, and subjecting the multilayer structure to laser annealing so as to modify a portion of the multilayer structure located in the second region, the portion including prior to laser annealing a part of the silicon-germanium layer, the portion having after laser annealing a germanium concentration gradient with a germanium concentration which increases towards an upper face of the portion.

Dependencies are inferred from the claim text.