Learning based tuning in a radio frequency plasma processing chamber
AssigneeApplied Materials, Inc.
InventorsYue GUO, Kartik RAMASWAMY, Yang YANG
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AssigneeApplied Materials, Inc.
InventorsYue GUO, Kartik RAMASWAMY, Yang YANG
Estimating the term…
Some embodiments are directed to a method of processing a substrate in a plasma processing system. The method generally includes tuning a first capacitor and a second capacitor of a tuning circuit to match a first impedance corresponding to a first stage of a waveform, while a frequency of a radio frequency (RF) generator is preset to a first frequency; tuning a third capacitor of the tuning circuit and the frequency of the RF generator to match a second impedance corresponding to a second stage of the waveform, wherein the frequency of the RF generator is tuned to a second frequency; recording setting values of the first frequency and the second frequency that match different impedances at different stages of the waveform; and switching between the first frequency and the second frequency to match the different impedances at the different stages of the waveform.
A method of processing a substrate in a plasma processing system, comprising:
A plasma processing chamber comprising:
A method of processing a substrate in a plasma processing system, comprising:
Dependencies are inferred from the claim text.