Semiconductor device
AssigneeSemiconductor Energy Laboratory Co., Ltd.
InventorsSeiya SAITO, Yuto YAKUBO, Tatsuya ONUKI, Shuhei NAGATSUKA
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AssigneeSemiconductor Energy Laboratory Co., Ltd.
InventorsSeiya SAITO, Yuto YAKUBO, Tatsuya ONUKI, Shuhei NAGATSUKA
Estimating the term…
A novel semiconductor device is provided. The semiconductor device includes a driver circuit including a plurality of transistors using a silicon substrate for channels, and a first transistor layer and a second transistor layer including a plurality of transistors using a metal oxide for channels. The first transistor layer and the second transistor layer are provided over the silicon substrate layer. The first transistor layer includes a first memory cell including a first transistor and a first capacitor. The first transistor is electrically connected to a first local bit line. The second transistor layer includes a second transistor whose gate is electrically connected to the first local bit line and a first correction circuit electrically connected to the second transistor. The first correction circuit is electrically connected to a first global bit line. The first correction circuit has a function of holding a voltage corresponding to a threshold voltage of the second transistor in the gate of the second transistor.
A semiconductor device comprising:
A semiconductor device comprising:
Dependencies are inferred from the claim text.