Apparatus and method with image generation
AssigneeSamsung Electronics Co., Ltd.
InventorsPrashant Pandurang SHINDE, Shashishekara Parampalli ADIGA, Priyadarshini Panemangalore PAI
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Abstract
A processor-implemented method with image generation includes: receiving a plurality of input parameters for a plurality of images to be generated; generating a plurality of defect profiles comprising a size and location of one or more defects to be formed in an image; and generating the plurality of images comprising defect information based on the plurality of defect profiles and the plurality of input parameters using an image rendering operation.
Claims20
A processor-implemented method with image generation, the method comprising:
- receiving a plurality of input parameters for a plurality of images to be generated;
- generating a plurality of defect profiles comprising a size and location of one or more defects to be formed in an image;
- and
- generating the plurality of images comprising defect information based on the plurality of defect profiles and the plurality of input parameters using an image rendering operation.
An apparatus with image generation, the apparatus comprising:
- one or more processors configured to:
- receive a plurality of input parameters for a plurality of images to be generated;
- generate a plurality of defect profiles comprising a size and location of one or more defects to be formed in an image;
- and
- generate the plurality of images comprising defect information based on the plurality of defect profiles and the plurality of input parameters using an image rendering operation.
A processor-implemented method with image generation, the method comprising:
- processing each of a plurality of generated images into a grid comprising a plurality of cells, wherein the plurality of images are generated based on a plurality of defect profiles and a plurality of input parameters using an image rendering operation;
- identifying an object by processing each cell in the grid using an object detection operation;
- and
- training a machine learning model by comparing coordinates of the identified object with coordinates stored in the plurality of defect profiles.
Dependencies are inferred from the claim text.