Remapping bad blocks in a memory sub-system
AssigneeMicron Technology, Inc.
InventorsYang Liu, Wenyen Chang, Wei Wang, Aaron Lee, Jiangli Zhu
Life of this patent
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AssigneeMicron Technology, Inc.
InventorsYang Liu, Wenyen Chang, Wei Wang, Aaron Lee, Jiangli Zhu
Estimating the term…
A system includes a memory device having a plurality of memory planes and a processing device operatively coupled with the memory device. The processing device to is perform operations including identifying a first block stripe of the memory device. The first block stripe includes a first plurality of blocks arranged across the plurality of memory planes. The operations further include determining that the first plurality of blocks of the first block stripe has greater than a threshold number of blocks associated with an error condition. Responsive to determining that the first plurality of blocks has greater than the threshold number of blocks associated with the error condition, the operations further include mapping a block of the first plurality of blocks associated with the error condition to a second block stripe including a second plurality of blocks having fewer than the threshold number of blocks associated with the error condition.
A system comprising:
A method comprising:
A non-transitory computer-readable storage medium comprising instructions that, when executed by a processing device, cause the processing device to perform operations comprising:
Dependencies are inferred from the claim text.