Systems and methods for improving find last good page processing in memory devices

A memory die, comprising:

• one or more NAND flash memory modules;
• and
• a circuitry component configured to:
• receive a command to identify a last good page of a memory block;
• perform a coarse inspection of one or more pages of the memory block, each iteration of the coarse inspection including:
• sensing a first number of bytes of a current page of the memory block from the one or more NAND flash memory modules;
• and
• evaluating a state of the current page based, at least in part, on contents of the first number of bytes;
• determine an initial last good page of the memory block based, at least in part, on the coarse inspection;
• perform a fine inspection of at least one page of the memory block based, at least in part, on contents of a second number of bytes of the at least one page, the second number of bytes being greater than the first number of bytes, the fine inspection validating the initial last good page identified by the coarse inspection;
• and
• transmit an index identifier of the last good page in response to the command to find the last good page.

A method for finding a last good page of a dirty block of non-volatile memory, the method comprising:

• identifying the dirty block within the non-volatile memory, the dirty block being a memory block that was subject to an interrupted input/output (I/O) operation, the interrupted I/O operation being one of a write operation and an erase operation;
• performing a coarse inspection of one or more pages of the dirty block, each iteration of the coarse inspection including:
• requesting a first number of bytes of a current page of the dirty block from the non-volatile memory;
• receiving contents of the first number of bytes from the non-volatile memory;
• and
• evaluating a state of the current page based, at least in part, on the contents of the first number of bytes;
• determining an initial last good page of the dirty block based, at least in part, on the coarse inspection;
• performing a fine inspection of at least one page of the dirty block based, at least in part, on contents of a second number of bytes of the at least one page of the dirty block, the second number of bytes being greater than the first number of bytes, the fine inspection validating the last good page identified by the coarse inspection;
• and
• initiating a remainder of the interrupted I/O operation starting after the last good page of the dirty block, the remainder including one of writing a remainder of data after the last good page and erasing pages after the last good page.