System and method for detecting a device state

Abstract

The invention relates to a system (1) for the automatic detection of a state of a device (2), comprising: a signal acquisition means (10) for acquiring defective measurement data (D) of a physical variable characterising the device (2); and an analysis unit (11) for identifying a specified pattern (M) in the measurement data (D) acquired by the signal acquisition means (10). The analysis unit (11) is designed:— to compare at least two different pattern sections (M1-M14) of the specified pattern (M) separately from each other with the measurement data (D):— on the basis of the respective comparison, to determine at least one position of each of the pattern sections (M1-M14) in the measurement data (D):— on the basis of the positions determined and the order of the positions of the pattern sections (M1-M14), to detect the specified pattern (M) at one or more positions in the measurement data (D) and,— on the basis of the one or more positions of the specified pattern (M), to determine the state of the device (2).

Dependencies are inferred from the claim text.