Determining a correlation between power disturbances and data erors in a test system
AssigneeTeradyne, Inc.
InventorChristopher C. JONES
Life of this patent
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Abstract
An example system for testing a device under test (DUT) includes one or more processing devices configured to receive first data from the DUT over a communication channel, and to analyze the first data to identify an error associated with the communication channel; and a power supply controller configured to receive second data based on a power disturbance from the DUT, and to compare the first data and the second data to determine if there is a correlation between the power disturbance and the error.
Claims40
A system for testing a device under test (DUT), the system comprising:
- one or more processing devices configured to receive first data from the DUT over a communication channel, and to analyze the first data to identify an error associated with the communication channel;
- and
- a power supply controller configured to receive second data based on a power disturbance from the DUT, and to compare the first data and the second data to determine if there is a correlation between the power disturbance and the error.
A method for testing a device under test (DUT), the method comprising:
- receiving first data from the DUT over a communication channel;
- analyzing the first data to identify an error associated with the communication channel;
- receiving second data based on a power disturbance from the DUT;
- and
- comparing the first data and the second data to determine if there is a correlation between the power disturbance and the error.
Dependencies are inferred from the claim text.