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US 2024/0192270 A1Published application
Test system
AssigneeTeraView Limited
InventorsBrian Edward Cole, Darius Sullivan, Simon Chandler
Life of this patent
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Abstract
A test system for testing a device having a plurality of electrical contacts. The test system comprising: a device table operable to hold at least one device under test, a probe comprising at least one probe end for contacting electrical contacts of a device under test, a movement mechanism operable to move one or both of the device table and the probe so as to bring the at least one probe end into contact with at least one electrical contact of a device under test, and a profile determining system configured to determine a profile of the electrical contacts of a device under test.
Claims3
A test system for testing a device, the test system comprising:
- a source of pulsed radiation configured to provide a generating radiation beam and a receiving radiation beam, wherein the generating and receiving radiation beams are pulsed radiation beams;
- a first signal conversion device arranged to receive a pulse of the generating radiation beam and configured to output a signal pulse in response to receiving a pulse of the generating radiation beam;
- a second signal conversion device arranged to receive a pulse of the receiving radiation beam and configured to sample a signal pulse in response to receiving a pulse of the receiving radiation beam;
- a transmission line arrangement configured to direct a signal pulse from the first signal conversion device to a device under test and to direct a signal pulse reflected from the device under test or transmitted through a device under test to the second signal conversion device;
- and
- a direct-drive delay line positioned in the optical path of the generating radiation beam and/or the receiving radiation beam, the delay line being configured to introduce an optical delay between the generating and receiving radiation beams such that a pulse of the generating radiation beam is incident on the first signal conversion device at a different time to a corresponding pulse of the receiving radiation beam being incident on the second signal conversion device;
- wherein the delay line comprises:
- at least one reflector positioned in the optical path of the generating and/or receiving radiation beams;
- and
- a synchronous linear motor configured to move the reflector so as to vary the optical path length of the generating and/or receiving radiation beams so as to vary the optical delay between the generating and receiving radiation beams.
7 more elements
A test system for testing a device, the test system comprising:
- a source of pulsed radiation configured to provide a generating radiation beam and a receiving radiation beam, wherein the generating and receiving radiation beams are pulsed radiation beams;
- a first signal conversion device arranged to receive a pulse of the generating radiation beam and configured to output a signal pulse in response to receiving a pulse of the generating radiation beam;
- a second signal conversion device arranged to receive a pulse of the receiving radiation beam and configured to sample a signal pulse in response to receiving a pulse of the receiving radiation beam;
- a transmission line arrangement configured to direct a signal pulse from the first signal conversion device to a device under test and to direct a signal pulse reflected from the device under test or transmitted through a device under test to the second signal conversion device;
- and
- a delay line comprising:
- a first reflector positioned in the optical path of the generating radiation beam;
- a second reflector positioned in the optical path of the receiving radiation beam;
- and
- a moveable stage on which the first reflector and the second reflector are mounted such that movement of the moveable stage in a first direction increases the optical path length of the generating radiation beam and decreases the optical path length of the receiving radiation beam and movement of the moveable stage in a second direction decreases the optical path length of the generating radiation beam and increases the optical path length of the receiving radiation beam.
7 more elements
A test system for testing a device, the test system comprising:
- a source of pulsed radiation configured to provide a generating radiation beam and a receiving radiation beam, wherein the generating and receiving radiation beams are pulsed radiation beams;
- a first signal conversion device arranged to receive a pulse of the generating radiation beam and configured to output a signal pulse in response to receiving a pulse of the generating radiation beam;
- a second signal conversion device arranged to receive a pulse of the receiving radiation beam and configured to sample a signal pulse in response to receiving a pulse of the receiving radiation beam;
- a transmission line arrangement configured to direct a signal pulse from the first signal conversion device to a device under test and to direct a signal pulse reflected from the device under test or transmitted through a device under test to the second signal conversion device;
- and
- a radiation feedback system comprising;
- a radiation sensor configured to detect the intensity of pulses of radiation emitted from the source of pulsed radiation;
- an attenuator positioned in the optical path of pulses of radiation emitted from the source of pulsed radiation, the attenuator being configured to reduce the intensity of the pulses of radiation by an adjustable amount;
- and
- a controller configured to adjust the amount by which the attenuator reduces the intensity of the pulses of radiation in response to measurements of the intensity of pulses of the radiation by the radiation sensor.
7 more elements
Dependencies are inferred from the claim text.