Method of monitoring a health state of a power semiconductor device
AssigneeROLLS-ROYCE plc
InventorsMohamed Sathik MOHAMED HALICK, Prasanth Sundararajan, Viswanathan Vaiyapuri, Sivakumar Nadarajan
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Abstract
A method of monitoring health of a power semiconductor device includes: determining a steady state loading of the power semiconductor device; when it is determined that the power semiconductor device is under a steady state loading, monitoring a case temperature parameter relating to a temperature of the case of the power semiconductor device over a predetermined period, derive a normalised parameter from the monitored case temperature parameter and determine the health of the power semiconductor device based on the normalised parameter.
Claims12
A method of monitoring health of a power semiconductor device, the method comprising:
- determining a steady state loading of the power semiconductor device;
- when it is determined that the power semiconductor device is under a steady state loading, monitoring a case temperature parameter relating to a temperature of the case of the power semiconductor device over a predetermined period,
- derive a normalised parameter from the monitored case temperature parameter and determine a health state of the power semiconductor device based on the normalised parameter.
Dependencies are inferred from the claim text.