Testing system and method for testing devices under test

Abstract

A testing system for testing a device under test comprises a test chamber with a test location for receiving the device under test. The testing system further comprises at least one first antenna with a corresponding reflector. The at least one first antenna is configured to transmit and/or receive an electromagnetic signal along an indirect beam path. The indirect beam path extends between said at least one first antenna and the device under test via the corresponding reflector. The testing system further comprises at least one second antenna configured to transmit and/or receive an electromagnetic signal along a direct beam path extending between said at least one second antenna and the device under test. The at least one first antenna and the corresponding reflector are arranged to provide a quiet zone at the test location. The at least one reflector can be rotated in a horizontal plane.

Dependencies are inferred from the claim text.