Particle characterisation
AssigneeMalvern Panalytical Limited
InventorsJason CORBETT, Alex MALM
Life of this patent
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Abstract
A method of characterising particles in a sample, comprising: obtaining a scattering measurement comprising a time series of measurements of scattered light from a detector, the scattered light produced by the interaction of an illuminating light beam with the sample; producing a corrected scattering measurement, comprising compensating for scattering contributions from contaminants by reducing a scattering intensity in at least some time periods of the scattering measurement; determining a particle characteristic from the corrected scattering measurement.
Claims16
A method of characterising particles in a sample, comprising:
- obtaining a scattering measurement comprising a time series of measurements of scattered light from a detector, the scattered light produced by the interaction of an illuminating light beam with the sample;
- producing a corrected scattering measurement, comprising compensating for scattering contributions from contaminants by reducing a scattering intensity in at least some time periods of the scattering measurement;
- determining a particle characteristic from the corrected scattering measurement,
- wherein reducing the scattering intensity comprises determining a model of scattering contributions from contaminants, and then subtracting the model from the scattering measurement.
An apparatus for characterising particles, comprising:
- a light source, a sample cell, a detector and a processor;
- wherein
- the light source is operable to illuminate a sample within the sample cell with a light beam so as to produce scattered light by interactions of the light beam with the sample;
- the detector is configured to detect the scattered light and produce a time series of measurements;
- and
- the processor is configured to:
- obtain a scattering measurement comprising a time series of measurements of the scattered light from the detector;
- produce a corrected scattering measurement, comprising compensating for scattering contributions from contaminants by reducing a scattering intensity in at least some time periods of the scattering measurement;
- determine a particle characteristic from the corrected scattering measurement, wherein reducing the scattering intensity comprises determining a model of scattering contributions from contaminants, and then subtracting the model from the scattering measurement.
Dependencies are inferred from the claim text.