Interconnect for Solid Oxide Cell (SOC)
AssigneeTopsoe A/S
InventorsTobias Holt NØRBY, Rainer KÜNGAS, Bengt Peter Gustav BLENNOW, Jeppe RASS-HANSEN, Thomas HEIREDAL-CLAUSEN, Louis SADOWSKI-CAVICHIOLO
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AssigneeTopsoe A/S
InventorsTobias Holt NØRBY, Rainer KÜNGAS, Bengt Peter Gustav BLENNOW, Jeppe RASS-HANSEN, Thomas HEIREDAL-CLAUSEN, Louis SADOWSKI-CAVICHIOLO
Estimating the term…
The present invention regards a high-temperature resistant interconnect structure for conducting an electrical current, the structure comprising a bulk layer of ferritic stainless steel; a nickel based metal oxide layer; and a surface layer interposed between the bulk layer and the nickel-rich metal oxide layer; where the surface layer comprises an austenitic phase and a discontinuous silicon oxide phase. It also regards a method of preparing the interconnect structure, an interconnect precursor structure as well as a SOC stack and a method of preparing the stack and uses of the stack as SOEC and SOFC.
A high-temperature resistant interconnect structure for conducting an electrical current, the structure comprising a bulk layer having a first and a second face, a first surface layer and a first metal oxide layer, wherein
A method for preparing a high-temperature resistant interconnect structure for conducting an electrical current comprising the steps of:
An interconnect precursor structure comprising a ferritic stainless steel substrate having a first and a second face and comprising above 0.1 wt. % silicon and a first nickel coating applied onto the first face of the substrate, wherein the first nickel coating has a thickness of from 2 to 12 μm.
Dependencies are inferred from the claim text.