Cathode active material for lithium secondary battery and lithium secondary battery including the same
AssigneesSK Innovation Co., Ltd., SK On Co., Ltd.
InventorsJi Yae DO, Min Suk KANG, Min Cheol BEAK, Kwang Ho LEE, Jae Young CHOI
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Abstract
A cathode active material for a lithium secondary battery according to an embodiment of the present disclosures a plurality of composite particles, each of which comprises a lithium metal phosphate particle, and a carbon coating formed on at least a portion of a surface of the lithium metal phosphate particle. A standard deviation of thickness values of the carbon coating measured by an X-ray photoelectron spectroscopy (XPS) for five different composite particles of the plurality of composite particles is 15 nm or less.
Claims13
A cathode active material for a lithium secondary battery comprising a plurality of a composite particle, each of which comprises:
- a lithium metal phosphate particle;
- and
- a carbon coating formed on at least a portion of a surface of the lithium metal phosphate particle,
- wherein a standard deviation of thickness values of the carbon coating measured by an X-ray photoelectron spectroscopy (XPS) for five different composite particles of the plurality of the composite particle is 15 nm or less.
A method of preparing a cathode active material for a lithium secondary battery, comprising:
- mixing a lithium source, a metal phosphate, a carbon source and a dispersing agent to form a mixed solution;
- drying the mixed solution to form a mixture;
- and
- calcining the mixture to form a cathode active material for a lithium secondary battery that comprises a plurality of composite particles, each of which comprises a lithium metal phosphate particle and a carbon coating formed on at least a portion of a surface of the lithium metal phosphate particle,
- wherein a standard deviation of thickness values of the carbon coating measured by an X-ray photoelectron spectroscopy (XPS) for five different composite particles of the plurality of composite particles is 15 nm or less.
Dependencies are inferred from the claim text.