Method for carrying out a system test of a laser processing system, control unit and laser processing system
AssigneeCarl Zeiss Meditec AG
InventorsWolf Weimer, Gregor Stobrawa, Mark Bischoff
Life of this patent
Estimating the term…
Abstract
A method for carrying out a system test of a laser processing system is disclosed. The method includes the execution of a functional test of a control element of the laser processing system. The method further includes the determination of a variable parameter and the determination of an influence of the determined variable parameter on an intended execution of a laser processing by means of the laser processing system. The execution of the functional test of the control element and the determination of the variable parameter overlap at least partially in time.
Claims22
A method for carrying out a system test of a laser processing system, the method comprising the steps of:
- carrying out a functional test of a control element of the laser processing system;
- and
- ascertaining a variable parameter and determining an influence of the ascertained variable parameter on an intended carrying out of laser processing with the laser processing system;
- wherein carrying out the functional test of the control element and ascertaining the variable parameter overlap one another at least partly in time,
- wherein the control element is a scanning device for beam deflection, and the functional test of the control element is a test of the scanning device with at least one control element sensor,
- wherein the test of the scanning device includes controlling the scanning device such that the scanning device is set in accordance with a scanning pattern for guiding a laser beam along a predetermined scanning path, wherein a respective setting of the scanning device for deflecting the laser beam with the scanning device is ascertainable with the at least one control element sensor, and
- wherein the scanning pattern is configured such that the laser beam in the region of the scanning path at least partly detects a reference object characterizing the variable parameter.
(canceled)
(canceled)
A control unit for a laser processing system, wherein the control unit is configured, ta context of a system test of the laser processing system to:
- carry out a functional test of the control element of the laser processing system;
- and
- ascertain a variable parameter and to ascertain an influence of the variable parameter on intended carrying out of laser processing by means of the laser processing system, and
- carry out the functional test of the control element and the ascertaining of the variable parameter in a manner overlapping one another at least partly in time and to receive and/or to evaluate resultant measurement data and/or measurement results at least partly simultaneously,
- wherein the control element is a scanning device for beam deflection, and the functional test of the control element is a test of the scanning device with at least one control element sensor,
- wherein the test of the scanning device includes controlling the scanning device such that the scanning device is set in accordance with a scanning pattern for guiding a laser beam along a predetermined scanning path, wherein a respective setting of the scanning device for deflecting the laser beam with the scanning device is ascertainable with the at least one control element sensor, and
- wherein the scanning pattern is configured such that the laser beam in the region of the scanning path at least partly detects a reference object characterizing the variable parameter.
Dependencies are inferred from the claim text.