Display driving ic device and probe test method using the same
AssigneeMagnaChip Semiconductor, Ltd.
InventorsDae Young YOO, Hyoung Kyu KIM, Yun Yeong PARK, Sang Ho LEE
Life of this patent
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Abstract
A display driving IC includes first channel block to Nth channel block each including M source amplifiers, N and M being an integer, source driving pads each connected to the M source amplifiers, a multiplexer configured to alternate data outputs of the source amplifiers or selectively provide a test path so that a probe test is performed on a plurality of source amplifiers for each of the first to Nth channel blocks through a test pad selected from the source driving pads, and a control unit configured to control driving of the source amplifiers and multiplexer.
Claims20
A display driving IC device, comprising:
- first channel block to Nth channel block each including M source amplifiers, N and M being an integer;
- source driving pads each connected to the M source amplifiers;
- a multiplexer configured to alternate data outputs of the source amplifiers or selectively provide a test path so that a probe test is performed on a plurality of source amplifiers for each of the first to Nth channel blocks through a test pad selected from the source driving pads;
- and
- a control unit configured to control driving of the source amplifiers and the multiplexer.
A method for performing a probe test using a display driving IC, the method comprising:
- externally shorting test pads of odd channel blocks adjacent to each other among first to Nth channel blocks, and externally shorting test pads of even channel blocks adjacent to each other among the first to Nth channel blocks;
- driving-on any one of the shorted pairs of channel blocks;
- and
- sequentially testing source channels of the channel blocks that have been driven-on by each measurement unit of a test equipment using a test pad in the corresponding channel block.
A method for performing a probe test using a display driving IC, the method comprising:
- performing a first test process, the first test process comprising:
- connecting a first measurement unit to a first channel block and a third channel block;
- connecting a second measurement unit to a second channel block and a fourth channel block;
- connecting a third measurement unit to a fifth channel block and a seventh channel block;
- and
- connecting a fourth measurement unit to a sixth channel block and an eighth channel block;
- and
- performing a probe test, by the first to fourth measurement units, on source channels provided in each of the first channel block, second channel block, fifth channel block, and sixth channel block, starting from a first source channel.
Dependencies are inferred from the claim text.