Seal failure detection system and methods
AssigneeCepheid
InventorsAristotelis Fotkatzikis, Vijay Venugopal, Melanie Senn, Koohong Chung, Robel Fessehatzion, Percy B. Burnett
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AssigneeCepheid
InventorsAristotelis Fotkatzikis, Vijay Venugopal, Melanie Senn, Koohong Chung, Robel Fessehatzion, Percy B. Burnett
Estimating the term…
Methods and systems for detecting defect in sample cartridges in real-time during manufacturing. Such systems utilize one or more external sensors that detect characteristics or parameters of the sample cartridge and/or the manufacturing process from one or more data sets. The external sensor(s) include any of: an RGB camera, IR camera, high-resolution optical camera, and ultrasonic microphone or combination thereof. An automated system obtains data sets from external sensor(s) and compares the data sets to a baseline of the sample cartridge and/or manufacturing process such that defects can be determined based on a variance from the baseline. Such methods can utilize feature extraction and spectrum analysis to identify features or characteristics for comparison with the baseline. A machine learning model can be used to determine an algorithm based on data sets of acceptable sample cartridges and data sets from the external sensor(s) that are associated with the cartridge defect.
A method of detecting a defect in a sample cartridge, the method comprising:
-41. (canceled)
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