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US 2024/0175813 A1Published application
Spectrum analysis system and spectrum analysis method
AssigneeShimadzu Corporation
InventorsRisa FUJI, Sachio MURAKAMI, Shoko IWASAKI
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Abstract
This spectrum analysis system has a measurer, a display, and a controller that displays plurality of first anomaly items that indicate the type of anomaly in appearance of the measurement spectrum waveform. The controller displays the first reference spectrum waveform for reference to a mode of appearance of the anomaly corresponding to each of the plurality of first anomaly items in the display.
Claims12
A spectrum analysis system comprising:
- a measurer configured to measure an inspection target;
- a display configured to display a measurement spectrum waveform based on a measurement result measured by the measurer;
- and
- a controller configured to control a function of displaying a plurality of first anomaly items that indicate a type(s) of anomaly/anomalies in appearance of the measurement spectrum waveform, and are selectable on the display, wherein
- the controller is configured to control a function of displaying a first reference spectrum waveform for reference to a mode(s) of appearance of an anomaly/anomalies corresponding to one of the plurality of the first anomaly items on the display for each of the plurality of first anomaly items.
2 more elements
A spectrum analysis method comprising:
- a step of displaying a measurement spectrum waveform based on a measurement result acquired by measuring an inspection target on a display;
- a step of displaying a plurality of first anomaly items that indicate a type(s) of anomaly/anomalies in appearance of the measurement spectrum waveform with being selectable on the display;
- and
- a step of displaying a first reference spectrum waveform for reference to a mode(s) of appearance of an anomaly/anomalies corresponding to one of the first anomaly items on the display for each of the plurality of first anomaly items.
1 more element
Dependencies are inferred from the claim text.