Back to results
US 2024/0175808 A1Published application
Analysis apparatus
AssigneeShimadzu Corporation
InventorHiroto TANAKA
Life of this patent
Estimating the term…
Abstract
An analysis apparatus according to this invention includes a measurer configured to measure a sample; a temperature adjuster configured to adjust a temperature of the sample during measurement; a display configured to display information: and a controller configured to control a function of displaying an interface on the display as the information, wherein the interface includes the followings: a plurality of items including temperature and time, and a graphic schematic diagram representing a thermal cycle with time and visualizing the plurality of items on the thermal cycle.
Claims11
An analysis apparatus comprising:
- a measurer configured to measure a sample;
- a temperature adjuster configured to adjust a temperature of the sample during measurement;
- a display configured to display information;
- and
- a controller configured to control a function of displaying an interface on the display as the information, wherein the interface includes the followings:
- a plurality of items including temperature and time, and
- a graphic schematic diagram representing a thermal cycle with time and visualizing the plurality of items on the thermal cycle.
4 more elements
Dependencies are inferred from the claim text.