Semiconductor Integrated Circuit and Semiconductor Device
AssigneeMitsubishi Electric Corporation
InventorOsamu NISHIKIDO
Life of this patent
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Abstract
In a semiconductor integrated circuit, a first analog circuit block operates by a voltage applied between a first node and a third node. Each of a plurality of first current sources has a first end connected to the third node and a second end connected to the first analog circuit block. The plurality of first current sources function as current sourcing or current sinking for the first analog circuit block. A first switch group is provided between the plurality of first current sources and the first analog circuit block, and in a test mode, individually switches electrical connection of the second end of each of the plurality of first current sources from the first analog circuit block to a second node.
Claims15
A semiconductor integrated circuit comprising:
- a first node;
- a second node;
- a third node;
- a first analog circuit block to operate by a voltage applied between the first node and the third node;
- a plurality of first current sources each having a first end connected to the third node and a second end connected to the first analog circuit block, to function as current sourcing or current sinking for the first alanlog circuit block;
- and
- a first switch group to be provided between the plurality of first current sources and the first analog circuit block, and in a test mode, to individually switch electrical connection of the second end of each of the plurality of first current sources from the first analog circuit block to the second node.
A semiconductor device comprising:
- the semiconductor integrated circuit including:
- a first node;
- a second node;
- a third node;
- a first analog circuit block to operate by a voltage applied between the first node and the third node;
- a plurality of first current sources each having a first end connected to the third node and a second end connected to the first analog circuit block, to function as current sourcing or current sinking for the first alanlog circuit block;
- and
- a first switch group to be provided between the plurality of first current sources and the first analog circuit block, and in a test mode, to individually switch electrical connection of the second end of each of the plurality of first current sources from the first analog circuit block to the second node;
- and
- a current measurement circuit connected to the second node, wherein
- the current measurement circuit includes:
- a current-voltage conversion circuit connected to the second node to convert current flowing out from the second node or flowing into the second node into a voltage;
- an analog-to-digital converter to convert a conversion voltage generated by the conversion of the current-voltage conversion circuit into a digital value;
- and
- a comparator to compare the digital conversion voltage output from the analog-to-digital converter with a reference value.
Dependencies are inferred from the claim text.