Method and System for Determining the Location of Artefacts and/or Inclusions in a Gemstone, Mineral, or Sample Thereof

A system for determining a location of artefacts and/or inclusions in a gemstone, mineral, or sample thereof, the system comprising:

• a surface mapping device arranged to surface map a gemstone, mineral, or sample thereof to determine surface geometry associated with at least a portion of a surface of the gemstone, mineral or sample thereof;
• a sub-surface mapping device arranged to sub-surface map the gemstone, mineral, or sample thereof using an optical beam that is directed at the surface along an optical beam path, wherein the optical beam is generated by an optical source using an optical tomography process;
• a computing system arranged to determine a surface normal at the surface at an intersection point between the optical beam path and the determined surface geometry;
• determine relative positioning between the surface normal and the optical beam path;
• and
• determine the location of artefacts and/or inclusions in the gemstone, mineral, or sample thereof based on the sub-surface mapping step and the determined relative positioning.