Analysing a field of a mass spectrometer
AssigneeThermo Fisher Scientific (Bremen) GmbH
InventorMarkus Pfeifer
Life of this patent
Estimating the term…
Abstract
A method of analysing a field of a mass spectrometer comprising a mass analyser and a static field mass filter having a first Wien filter and a second Wien filter is provided. The method includes, for each of a plurality of predetermined strengths of one of an electric field or a magnetic field of the first and second Wien filters: setting the one of the electric field or the magnetic field of the first and second Wien filters to the predetermined strength; causing a beam of ions comprising one or more ion species to be injected through the static field mass filter; and measuring, using the mass analyser, a respective intensity of ions of each of the one or more ion species in the beam.
Claims20
A method of analysing a field of a mass spectrometer comprising a mass analyser and a static field mass filter having a first Wien filter and a second Wien filter, the method comprising:
- for each of a plurality of predetermined strengths of one of an electric field or a magnetic field of the first and second Wien filters:
- setting the one of the electric field or the magnetic field of the first and second Wien filters to the predetermined strength;
- causing a beam of ions comprising one or more ion species to be injected through the static field mass filter;
- and
- measuring, using the mass analyser, a respective intensity of ions of each of the one or more ion species in the beam.
An apparatus comprising a processor configured to perform a method of analysing a field of a mass spectrometer comprising a mass analyser and a static field mass filter having a first Wien filter and a second Wien filter, the method comprising:
- for each of a plurality of predetermined strengths of one of an electric field or a magnetic field of the first and second Wien filters:
- setting the one of the electric field or the magnetic field of the first and second Wien filters to the predetermined strength;
- causing a beam of ions comprising one or more ion species to be injected through the static field mass filter;
- and
- measuring, using the mass analyser, a respective intensity of ions of each of the one or more ion species in the beam.
A non-transitory computer-readable medium comprising instructions which, when executed by a processor of an apparatus, cause the apparatus to perform a method of analysing a field of a mass spectrometer comprising a mass analyser and a static field mass filter having a first Wien filter and a second Wien filter, the method comprising:
- for each of a plurality of predetermined strengths of one of an electric field or a magnetic field of the first and second Wien filters:
- setting the one of the electric field or the magnetic field of the first and second Wien filters to the predetermined strength;
- causing a beam of ions comprising one or more ion species to be injected through the static field mass filter;
- and
- measuring, using the mass analyser, a respective intensity of ions of each of the one or more ion species in the beam.
Dependencies are inferred from the claim text.