Electrical contact

Abstract

An electrical contact for a semiconductor device, and a method of forming an electrical contact is disclosed. The electrical contact comprises a perimeter area, an aperture located within the perimeter area and one or more electrical tracks extending from the perimeter area into the aperture. The one or more electrical tracks comprise a non-linear shape. The presence of the one or more electrical tracks within the aperture provides a means to remove, or significantly reduce, the problematic effects of current crowding within a semiconductor device in which it is employed. The electrical contacts provide particular application for semiconductor laser devices. When the electrical contact is located on an output surface of the semiconductor laser device, the condition for a diffraction pattern to be imparted onto the emission profile of the output light of the semiconductor laser device is removed, thus improving the overall beam quality of the output light.

Dependencies are inferred from the claim text.