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US 2024/0077461 A1Published application
Ion chromatography analysis system
AssigneeShimadzu Corporation
InventorTakuya YONEKURA
Life of this patent
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Abstract
An ion chromatography analysis system includes a system monitoring part being configured to detect an abnormality, to determine, based on a fluctuation rate in a certain time of the predetermined state of a most recent of the monitor value, whether the fluctuation is a short-term fluctuation that occurs in a short term or a long-term fluctuation that occurs in a long term, and to identify a cause of the abnormality by using whether the fluctuation is the short-term fluctuation or the long-term fluctuation.
Claims5
An ion chromatography analysis system comprising:
- a liquid feeding pump that feeds an eluent;
- a sample injection part that is fluidly connected downstream of the liquid feeding pump and is configured to inject a sample into the eluent fed by the liquid feeding pump;
- a separation column that is fluidly connected downstream of the sample injection part and is for separating ion components, included in the sample injected into the eluent by the sample injection part, from each other;
- a suppressor that is fluidly connected downstream of the separation column and is configured to remove predetermined ion components in the eluent by applying a suppressor voltage to a channel through which the eluent flowing out from an outlet of the separation column flows;
- a detector that is fluidly connected to an outlet of the suppressor and measures electrical conductivity of the eluent flowing out from the suppressor;
- and
- a system monitoring part configured to monitor a monitor value including a base ground value of a measurement value of the detector and the suppressor voltage, and to determine, at a predetermined timing in a predetermined state where an eluent has been fed by the liquid feeding pump, whether or not a fluctuation of the monitor value in the predetermined state from a past occurs, when determine that the fluctuation occurs, the system monitoring part being configured to detect an abnormality, to determine, based on a fluctuation rate in a certain time of the predetermined state of a most recent of the monitor value, whether the fluctuation is a short-term fluctuation that occurs in a short term or a long-term fluctuation that occurs in a long term, and to identify a cause of the abnormality by using whether the fluctuation is the short-term fluctuation or the long-term fluctuation.
4 more elements
Dependencies are inferred from the claim text.