Back to results
US 2024/0069744 A1Published application
Apparatus with signal quality feedback
AssigneeMicron Technology, Inc.
InventorJackson Callaghan
Life of this patent
Estimating the term…
Abstract
Methods, apparatuses, and systems related to operations for measuring the quality of a signal received by a memory device and providing feedback. The memory device can sample signal data using a predetermined sequence of timing offsets relative to a reference signal. Additionally or alternatively, the memory device can sample the signal data using a predetermined sequence of reference voltages. The memory device can provide feedback results to a controller regarding the quality of the sampled signal data.
Claims20
An apparatus, comprising:
- a communication circuit configured to communicate signals with an external controller, wherein the communicated signals include a data pattern from an external controller;
- a logic circuit coupled to the communication circuit and configured to:
- generate first sampling results of the data pattern or a portion thereof using (1) a first reference voltage level and/or (2) a first timing offset value relative to a clock signal;
- and
- generate second sampling results of the data pattern or a different portion thereof using (1) using the first reference voltage level and/or (2) a second timing offset value relative to the clock signal, wherein
- the communication circuit is configured to send the first sampling results and the second sampling results or a representation of the first and second sampling results to the external controller for adjusting a voltage setting and/or a timing associated with subsequently communicated signals.
3 more elements
A memory system, comprising:
- a memory controller;
- a memory array operably coupled to the memory controller and configured to:
- receive a signal pattern from the memory controller;
- generate first sampling results of the signal pattern using (1) a first reference voltage level and (2) a first timing offset value relative to a clock signal;
- generate second sampling results of the signal pattern using (1) the first reference voltage level and (2) a second timing offset value relative to the clock signal;
- and
- send the first sampling results and the second sampling results to the memory controller,
- wherein
- the memory controller and/or the memory are/is configured to adjust a setting for communicating or processing subsequent signals according to the first and second sampling results.
6 more elements
A method of operating an apparatus, the method comprising:
- generating first sampling results of a data pattern or a portion thereof using (1) a first reference voltage level and/or (2) a first timing offset value relative to a clock signal;
- and
- generating second sampling results of the data pattern or a different portion thereof using (1) using the first reference voltage level and/or (2) a second timing offset value relative to the clock signal;
- and
- sending the first sampling results and the second sampling results or a representation of the first and second sampling results to an external controller for adjusting a voltage setting and/or a timing associated with subsequently communicated signals.
2 more elements
Dependencies are inferred from the claim text.