Data processing method, and electronic device and storage medium

A data processing method, comprising:

• receiving a sample screening condition of an input of a user on a condition selection interface;
• acquiring a production record of each sample of a plurality of samples corresponding to the sample screening condition, wherein the production record includes process information, a production time corresponding to the process information, and an index value;
• the process information includes at least one of a process parameter and a process step;
• the index value is used to represent a defect degree of the sample with regard to a preset defect type;
• the plurality of samples includes defective samples, and index values of the defective samples are greater than a first threshold value;
• determining a high-incidence time period of defects according to index values and production times corresponding to the process information in acquired production records of the plurality of samples, the high-incidence time period of defects being a time period in which a distribution probability of defective samples is greater than a second threshold value;
• and
• determining an influence degree of the process information on sudden defect according to the high-incidence time period of defects and the acquired production records;
• and
• displaying the influence degree of the process information on the sudden defect on an analysis result display interface.