US 2023/0420985 A1Published application

Systems and methods for testing a device as per grid interconnection standards

AssigneeBloom Energy Corporation

InventorsVishal Anand Aisur GOPALAKRISHNAN, Saravanakumar NARAYANASAMY, Badrinarayanan THIRUVENGADASAMY, Sreekanth VENKATESH, Vishal VARSHNEY, Anbarasu DORAI, Kodali Venkata Narasimha RAO

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Abstract

Embodiments of the present disclosure provide systems and methods for testing a device for grid interconnection standards. The method includes inputting a set of instructions to a device under test (DUT), where the instructions correspond to a firmware version to be tested by a variable AC source. The method includes transmitting a command signal to an inverter redundant controller (IRC) of the DUT, where the IRC operates at least one DC-AC inverter to attain a grid-tie state in response to receipt of the command signal. The method includes transmitting a set of values corresponding to parameters of the variable AC source configured to simulate an AC grid upon operating at least one DC-AC inverter in the grid-tie state. The method further includes accessing test output data of the DUT from measuring equipment and generating a test report based on responses of the DUT to a set of test waveforms.

Claims20

Dependent claims

A computer-implemented method, comprising:

inputting, by a central controller, a set of instructions to a device under test, the set of instructions corresponding to a firmware version to be tested by a variable alternating current (AC) source electrically coupled to the device under test;
transmitting, by the central controller, a command signal to an inverter redundant controller (IRC) of the device under test, the IRC configured to operate at least one direct current-to-alternating current (DC-AC) inverter, among a plurality of DC-AC inverters of the device under test, to attain a grid-tie state in response to receipt of the command signal;
upon operating the at least one DC-AC inverter in the grid-tie state, transmitting, by the central controller, a set of values corresponding to parameters of the variable AC source configured to simulate an AC grid, the set of values derived based at least on a grid interconnection standard, and wherein the set of values facilitates for generation of a set of test waveforms by the variable AC source;
accessing, by the central controller, test output data of the device under test from a measuring equipment, the test output data comprising information related to the response of the device under test corresponding to each test waveform of the set of test waveforms;
and
generating, by the central controller, a test report based at least on the responses of the device under test to the set of test waveforms.

3 more elements

A system for testing a device under test comprising a plurality of direct current-to-alternating current (DC-AC) inverters and an inverter redundant controller (IRC), the system comprising:

a variable AC source electrically coupled to the device under test, the variable AC source configured to simulate an AC grid to test the device under test;
a measuring equipment coupled to the device under test and the variable AC source;
and
a central controller communicably coupled to the device under test, the variable AC source, and the measuring equipment, the central controller configured to:
input a set of instructions to the device under test, wherein the set of instructions corresponds to a firmware version to be tested by the variable AC source;
transmit a command signal to the IRC of the device under test, wherein the IRC operates at least one DC-AC inverter, among the plurality of DC-AC inverters, to attain a grid-tie state in response to receipt of the command signal;
upon operation of the at least one DC-AC inverter in the grid-tie state, transmit a set of values corresponding to parameters of the variable AC source, wherein the set of values is derived based at least on the grid interconnection standards, and wherein the set of values facilitates for generation of a set of test waveforms by the variable AC source;
access test output data of the device under test from the measuring equipment, the test output data comprising information related to the response of the device under test corresponding to each test waveform of the set of test waveforms;
and
generate a test report based at least on the responses of the device under test to the set of test waveforms.

7 more elements

Dependencies are inferred from the claim text.