Semiconductor test apparatus capable of inducing reduction of power consumption
AssigneeYIK Corporation
InventorsHyo Sang JO, Wan Soon PARK, Yong Hyun KIM, Jae Hoon JOO
Life of this patent
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Abstract
A semiconductor test apparatus is provided. The semiconductor test apparatus includes: a test management unit determining a test mode, generating a test signal in accordance with the determined test mode, and transmitting the test signal to fail memories; and one or more fail memory boards including the fail memory, which store fail signals generated as a result of a test conducted in accordance with the test signal and address information of the fail signals, wherein if the determined test mode is a first test mode, at least some of the failure memory boards are powered off.
Claims20
A semiconductor test apparatus comprising:
- a test management unit determining a test mode, generating a test signal in accordance with the determined test mode, and transmitting the test signal to fail memories, which store fail signals generated as a result of a test conducted in accordance with the test signal and address information of the fail signals;
- and
- one or more fail memory boards including the fail memory,
- wherein if the determined test mode is a first test mode, at least some of the failure memory boards are powered off.
A semiconductor test apparatus comprising:
- a test management unit generating a test signal in accordance with a test program, transmitting the test signal to fail memories, calculating an amount of input/output (I/O) usage in connection with the execution of the test program, and determining whether to generate a fourth control signal based on the calculated amount of I/O usage;
- and
- a plurality of fail memory boards including fail memory, which include fail signals generated as a result of a test conducted in accordance with the test signal and address information of the fail signals,
- wherein when the fourth control signal is generated, some of the fail memory boards are powered off.
Dependencies are inferred from the claim text.