Memory fault notification
AssigneeMicron Technology, Inc.
InventorScott E. Schaefer
Life of this patent
Estimating the term…
Abstract
Methods, systems, and devices for memory fault notification are described. A memory device may receive a configuration corresponding to a circuit node of the memory device, where the circuit node may be selectively coupled with a set of resistors. The memory device may determine a fault condition and couple the circuit node to at least a first resistor based on determining the fault condition. The memory device may bias the circuit node to a first voltage value that satisfies a voltage threshold based on coupling the circuit node to the first resistor. The memory device may output an indication of a fault state to notify a host device that a fault has been detected.
Claims25
A method, comprising:
- receiving a configuration for a memory device, the configuration corresponding to a circuit node of the memory device, the circuit node selectively coupled with a set of resistors associated with the memory device;
- coupling the circuit node to a first resistor of the set of resistors based at least in part on a fault condition associated with the memory device;
- and
- biasing the circuit node of the memory device to a first voltage value satisfying a first voltage threshold based at least in part on coupling the circuit node to the first resistor.
An apparatus, comprising:
- a circuit comprising a set of resistors;
- a switch operable to couple one or more resistors of the set of resistors to a circuit node;
- and
- a controller operable to cause the apparatus to:
- receive a configuration for the apparatus, the configuration corresponding to the circuit node of the circuit;
- couple the circuit node to a first resistor of the set of resistors based at least in part on detecting a fault condition associated with the apparatus;
- and
- bias the circuit node of the circuit to a first voltage value based at least in part on the coupling, the first voltage value satisfying a first voltage threshold.
An apparatus, comprising:
- a memory device;
- and
- a controller configured to couple with the memory device and configured to cause the apparatus to:
- receive a configuration for the memory device, the configuration corresponding to a circuit node of the memory device, the circuit node selectively coupled with a set of resistors associated with the memory device;
- couple the circuit node to a first resistor of the set of resistors based at least in part on detecting a fault condition associated with the memory device;
- and
- bias the circuit node of the memory device to a first voltage value satisfying a first voltage threshold based at least in part on coupling the circuit node to the first resistor, the first voltage value.
Dependencies are inferred from the claim text.