Methods and apparatus for assisted data review for active learning cycles
AssigneeIntel Corporation
InventorsVinnam Kim, Wonju Lee, Seok-Yong Byun
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AssigneeIntel Corporation
InventorsVinnam Kim, Wonju Lee, Seok-Yong Byun
Estimating the term…
Systems, apparatus, articles of manufacture, and methods are disclosed for assisted data review for active learning cycles. An example apparatus includes programmable circuitry to at least one of instantiate or execute the machine readable instructions to: determine a first training loss associated with a first data point of training data for training a machine learning model; determine a second training loss associated with a second data point of the training data; rank the training data based on aggregate statistics of the first and second training losses; select, based on the rank, the first data point for annotation; and modify an existing label of the first data point based on the annotation.
An apparatus comprising:
A non-transitory computer readable storage medium comprising instructions to cause programmable circuitry to at least:
A method comprising:
Dependencies are inferred from the claim text.