Method and apparatus for detecting foreign object included in inspection target
AssigneePanasonic Intellectual Property Management Co., Ltd.
InventorKAZUAKI NISHIO
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AssigneePanasonic Intellectual Property Management Co., Ltd.
InventorKAZUAKI NISHIO
Estimating the term…
A method for detecting a foreign object included in an inspection target includes acquiring first image data for the target, for which pixels each have a pixel value for a first band group including one or more wavelength bands; determining, from the first image data, one or more pixel regions that satisfy a first condition to be one or more first foreign object regions; acquiring second image data for one or more regions including the first foreign object regions, the one or more regions having pixels each of which has pixel values for a second band group including a larger number of wavelength bands than the first band group; determining, from the second image data, one or more pixel regions that satisfy a second condition to be one or more second foreign object regions, in which the foreign object is present; and outputting information regarding the second foreign object regions.
A method for detecting a specific foreign object included in an inspection target, the method comprising:
An apparatus performs an operation for detecting a foreign object included in an inspection target, comprising:
A non-transitory computer-readable recording medium storing a program for detecting a foreign object included in an inspection target, the program causing a computer to execute:
A method for detecting a foreign object included in an inspection target, comprising:
Dependencies are inferred from the claim text.