Image defect identification method and image analysis device
AssigneeVivotek Inc.
InventorChung-Kai Chang
Life of this patent
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Abstract
An image defect identification method is applied to an image analysis device with an image receiver and an operation processor. The image defect identification method divides a detection image acquired by the image receiver into a plurality of pixel groups, transforms one of the plurality of pixel groups into a distribution curve, compares the distribution curve with a reference curve, and determines an area of the detection image conforming to a specific section of the distribution curve has defect when a difference between the specific section of the distribution curve and a related section of the reference curve is greater than a predefined threshold.
Claims20
An image defect identification method applied to an image analysis device with an image receiver and an operation processor, the image defect identification method comprising:
- the operation processor dividing a detection image acquired by the image receiver into a plurality of pixel groups;
- the operation processor transforming one of the plurality of pixel groups into a distribution curve;
- the operation processor comparing the distribution curve with a reference curve;
- and
- the operation processor determining an area of the detection image conforming to a specific section of the distribution curve has defect when a difference between the specific section of the distribution curve and a related section of the reference curve is greater than a predefined threshold.
An image analysis device comprising:
- an image receiver adapted to acquire a detection image;
- and
- an operation processor electrically connected with the image receiver in a wire manner or in a wireless manner, and adapted to divide the detection image into a plurality of pixel groups, transform one of the plurality of pixel groups into a distribution curve, compare the distribution curve with a reference curve, and determine an area of the detection image conforming to a specific section of the distribution curve has defect when a difference between the specific section of the distribution curve and a related section of the reference curve is greater than a predefined threshold.
Dependencies are inferred from the claim text.