System log pattern analysis by image similarity recognition
AssigneeInternational Business Machines Corporation
InventorsChuan Li, Gang Lyu, Jun Gu, HONG ZHOU
Life of this patent
Estimating the term…
Loading patent…
AssigneeInternational Business Machines Corporation
InventorsChuan Li, Gang Lyu, Jun Gu, HONG ZHOU
Estimating the term…
The present invention may include an embodiment that identifies a log database with known error patterns. The embodiment may map the known error patterns into plurality of diagrams. The embodiment may train an artificial intelligence (AI) algorithm with the plurality of diagrams, where the AI algorithm compares diagrams and returns a distance value. The embodiment may identify logs for a new error pattern. The embodiment may map the new error pattern to a two-dimensional diagram. The embodiment may compare the two-dimensional diagram to the plurality of diagrams using the AI algorithm and identify log data of the at least one diagram based on determining a distance value is below a threshold for at least one diagram within the plurality of diagrams
A processor-implemented method for log pattern analysis, the method comprising:
A computer system for log pattern analysis, the computer system comprising:
A computer program product for log pattern analysis , the computer program product comprising:
Dependencies are inferred from the claim text.