Storage workload allocation based on input/output pattern affinity calculations
AssigneeDell Products L.P.
InventorsChi Chen, Hailan Dong, Huijuan Fan
Life of this patent
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AssigneeDell Products L.P.
InventorsChi Chen, Hailan Dong, Huijuan Fan
Estimating the term…
An apparatus comprises a processing device configured to identify storage workloads to be run on a storage system, and to determine a mix of input/output (TO) patterns associated with the identified storage workloads, the mix of IO patterns comprising a first set of IO patterns characterizing types of IO operations performed by a first storage workload and at least a second set of IO patterns characterizing types of IO operations performed by a second storage workload. The processing device is also configured to calculate an affinity metric for the mix of IO patterns, the calculated affinity metric characterizing a difference between (i) performance metrics for the mix of IO patterns running concurrently and (ii) the first and second sets of IO patterns running individually. The processing device is further configured to allocate the identified storage workloads to storage devices of the storage system based on the calculated affinity metric.
An apparatus comprising:
A computer program product comprising a non-transitory processor-readable storage medium having stored therein program code of one or more software programs, wherein the program code when executed by at least one processing device causes the at least one processing device to perform steps of:
A method comprising:
Dependencies are inferred from the claim text.