Photonic Package and Method of Manufacture
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsTsung-Fu Tsai, Hsing-Kuo Hsia, Szu-Wei Lu, Chen-Hua Yu
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Abstract
A package includes a laser diode includes a bonding layer; a first dielectric layer over the laser diode, wherein the first dielectric layer is directly bonded to the bonding layer of the laser diode; a first silicon nitride waveguide in the first dielectric layer, wherein the first silicon nitride waveguide extends over the laser diode; a second dielectric layer over the first silicon nitride waveguide; a silicon waveguide in the second dielectric layer; an interconnect structure over the silicon waveguide; and conductive features extending through the first dielectric layer and the second dielectric layer to electrically contact the interconnect structure.
Claims20
A method comprising:
- forming a first set of waveguides on a first side of a first dielectric layer, wherein the first set of waveguides comprises a photonic device;
- forming a redistribution structure over the first set of waveguides, wherein the redistribution structure is electrically connected to the photonic device;
- forming a second set of waveguides on a second side of the first dielectric layer, wherein the first set of waveguides and the second set of waveguides comprise different materials;
- forming a second dielectric layer over the second set of waveguides;
- bonding a laser substrate die to the second dielectric layer using a dielectric-to-dielectric bonding process;
- and
- processing the laser substrate die to form a laser diode, wherein the laser diode is coupled to a waveguide of the second set of waveguides.
A method comprising:
- forming a silicon waveguide over a top surface of an oxide layer, wherein the oxide layer is over a top surface of a substrate;
- forming a photonic device over the top surface of the oxide layer, wherein the photonic device is optically coupled to the silicon waveguide;
- forming a redistribution structure over the silicon waveguide and the photonic device, wherein the redistribution structure is electrically connected to the photonic device;
- bonding a semiconductor die to the redistribution structure, wherein the semiconductor die is electrically connected to the redistribution structure;
- removing the substrate to expose a bottom surface of the oxide layer;
- forming a first silicon nitride waveguide over the bottom surface of the oxide layer, wherein the first silicon nitride waveguide is optically coupled to the silicon waveguide;
- forming a dielectric layer over the first silicon nitride waveguide and over the bottom surface of the oxide layer;
- directly bonding a laser diode to the dielectric layer, wherein the laser diode is optically coupled to the first silicon nitride waveguide;
- and
- forming vias over the bottom surface of the oxide layer, wherein the vias are electrically connected to the laser diode and the redistribution structure.
A package comprising:
- a laser diode comprising a bonding layer;
- a first dielectric layer over the laser diode, wherein the first dielectric layer is directly bonded to the bonding layer of the laser diode;
- a first silicon nitride waveguide in the first dielectric layer, wherein the first silicon nitride waveguide extends over the laser diode;
- a second dielectric layer over the first silicon nitride waveguide;
- a silicon waveguide in the second dielectric layer;
- an interconnect structure over the silicon waveguide;
- and
- conductive features extending through the first dielectric layer and the second dielectric layer to electrically contact the interconnect structure.
Dependencies are inferred from the claim text.