Training method and test apparatus using the same
AssigneeSamsung Electronics Co., Ltd.
InventorsKwang Kyu KIM, Jae-ll Choi
Life of this patent
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AssigneeSamsung Electronics Co., Ltd.
InventorsKwang Kyu KIM, Jae-ll Choi
Estimating the term…
Provided is a training method capable of reducing or minimizing a training time. The training method includes, for each of devices to be tested, calculating a first eye width at which a first signal and a second signal synchronize with each other at a first operation speed, and calculating a second eye width at which the first signal and the second signal synchronize with each other at a second operation speed different from the first operation speed; performing machine learning on the first eye width and the second eye width to derive a model showing a relation between operation speeds and eye widths; and calculating a third eye width corresponding to a third operation speed different from the first operation speed and the second operation speed, using the model.
A training method comprising:
A training method comprising:
A test apparatus comprising:
Dependencies are inferred from the claim text.