Method for measuring quiescent current in a switching voltage regulator

A method for measuring a quiescent current in a boost switching voltage regulator, the method comprising:

• generating a mathematical model of a circuit design associated with the boost switching voltage regulator, the mathematical model comprising measurable parameters to describe an average switching current and internal operational currents associated with a power switch of the boost switching voltage regulator;
• fabricating a circuit comprising the boost switching voltage regulator based on the circuit design, the fabricated circuit comprising the power switch and conductive inputs/outputs (I/O);
• coupling the conductive I/O of the fabricated circuit to a circuit test fixture;
• providing electrical signals to the conductive I/O via the circuit test fixture;
• measuring the measurable parameters in response to the electrical signals;
• applying the measurable parameters to the mathematical model to calculate the average switching current;
• and
• calculating the quiescent current based on the average switching current and the internal operational currents associated with the mathematical model.

A method for measuring a quiescent current in a switching voltage regulator, the method comprising:

• generating a mathematical model of a circuit design associated with the switching voltage regulator, the mathematical model comprising measurable parameters to describe an average switching current associated with a power switch of the switching voltage regulator, the measurable parameters comprising a peak switching current, a capacitor voltage, and internal operational currents of the switching voltage regulator;
• fabricating a circuit comprising the switching voltage regulator based on the circuit design, the fabricated circuit comprising the power switch, a first lead adapted to be coupled to an inductor, and a second lead adapted to be coupled to a capacitor;
• coupling the first and second leads of the fabricated circuit to a circuit test fixture;
• providing electrical signals to the first and second leads via the circuit test fixture;
• measuring the measurable parameters in response to the electrical signals;
• applying the measurable parameters to the mathematical model to calculate the average switching current;
• and
• calculating the quiescent current based on the average switching current and the internal operational currents associated with the mathematical model.