Electronic component handling apparatus, electronic component testing apparatus, electronic component testing

An electronic component handling apparatus for handling a device under test (DUT) and pressing the DUT against a socket electrically connected to a tester testing the DUT, the electronic component handling apparatus comprising:

• a first receiver that receives, from the tester, a first signal indicating a detection value of a temperature detection circuit of the DUT;
• a calculator that calculates a temperature of the DUT based on the first signal and obtains a calculated temperature;
• a calibrator that calibrates the calculated temperature;
• a second receiver that receives, from the tester, a second signal that causes the calibrator to start a first calibration;
• and
• a temperature adjuster that adjusts the temperature of the DUT, wherein
• the second receiver receives the second signal before the tester turns on the DUT,
• once the second receiver receives the second signal, the calibrator calculates a first calibrated temperature by executing the first calibration with respect to the calculated temperature, and
• the temperature adjuster adjusts the temperature of the DUT based on the first calibrated temperature.