Method and system for testing phased array antenna with independent signal calibration
AssigneeTron Future Tech Inc.
InventorsLI HAN CHANG, YU-JIU WANG
Life of this patent
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Abstract
A method of testing an antenna array includes: receiving a probe needle set and a shielding structure, wherein the shielding structure includes an array of conductive pads. The antenna array includes a substrate and an array of antenna devices. Each of the antenna devices includes: a first and a second slits; a first and a second signal ports; a first and a second feed lines. The first and second feed lines have different line lengths; and a radiation element. The method further includes: causing the shielding structure to cover the radiation element of at least one antenna device; and causing the probe needle set to contact the first and second feed lines for testing the at least one antenna device.
Claims20
A method for testing an antenna array, comprising:
- receiving a probe needle set and a shielding structure, wherein the shielding structure comprises an array of conductive pads, wherein the antenna array includes a substrate and an array of antenna devices, each of the antenna devices comprising:
- a first slit and a second slit arranged in a first layer on a first surface of the substrate;
- a first signal port and a second signal port arranged in a second layer adjacent to the first layer;
- a first feed line and a second feed line arranged in the second layer and connected to the first signal port and the second signal port, respectively, wherein the first feed line and the second feed line have different line lengths;
- and
- a radiation element disposed in a third layer on a second surface of the substrate opposite to the first surface;
- causing the shielding structure to cover the radiation element of at least one antenna device;
- and
- causing the probe needle set to contact the first feed line and the second feed line for testing the at least one antenna device.
A probing system for testing at least one antenna device during a testing operation, comprising:
- a probe needle set;
- a shielding structure comprising an array of conductive pads configured to cover the at least one antenna device,
- wherein each of the at least one antenna device comprising:
- a substrate;
- a first ground plate arranged in a first layer on a first surface of the substrate;
- a first signal port and a second signal port arranged in a second layer adjacent to the first layer;
- a first feed line and a second feed line arranged in the second layer and connected to the first signal port and the second signal port, respectively, wherein the first feed line and the second feed line have different line lengths;
- a radiation element in a third layer on a second surface of the substrate opposite to the first surface;
- and
- a first slit and a second slit arranged in the first layer and defined by the first ground plate,
- wherein the shielding structure is configured to cover the radiation element of the at least one antenna device in the first testing operation,
- wherein the probe needle set is configured to contact the first feed line and the second feed line in the first testing operation.
Dependencies are inferred from the claim text.