Automated test device and test method for complex accelerated degradation test
AssigneesKorea Research Institute of Chemical Technology, Nexo
InventorsDoo Jin BYUN, Ho JUNG, Youngho PARK, Hyosang EOM
Life of this patent
Estimating the term…
Loading patent…
AssigneesKorea Research Institute of Chemical Technology, Nexo
InventorsDoo Jin BYUN, Ho JUNG, Youngho PARK, Hyosang EOM
Estimating the term…
The present invention relates to an accelerated degradation test for testing durability of a specimen by rapidly inducing a failure or degradation rate according to use environmental factors, such as temperature and humidity, and more particularly, to an automated test device and test method for a complex accelerated degradation test, capable of various and precise accelerated degradation tests by constructing a multi-test environment in a single device and automating a process of putting pre-test specimens formed of chemical materials into a test environment, transferring the specimens to other test environments, and storing tested specimens in a storage chamber.
An automated test device for a complex accelerated degradation test, the automated test device comprising:
Dependencies are inferred from the claim text.