Machine learning techniques for circuit design debugging
AssigneeTexas Instruments Incorporated
InventorsVenkateswaran PADMANABHAN, Guha LAKSHMANAN, Kriyangbhai SHAH, Ibinu ALAUDEEN NADEERA
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Abstract
A method includes obtaining input signal values and output signal values from an integrated circuit and providing the obtained input signal values and output signal values to a machine learning model. The method further includes obtaining, from the machine learning model, a predicted set of signal values, wherein the predicted set of signal values correspond to signals internal to the integrated circuit and comparing the predicted set of signal values to one or more expected signal values for debugging the integrated circuit.
Claims20
A method, comprising:
- obtaining input signal values and output signal values from an integrated circuit;
- providing the obtained input signal values and output signal values to a machine learning model;
- obtaining, from the machine learning model, a predicted set of signal values, wherein the predicted set of signal values correspond to signals internal to the integrated circuit;
- comparing the predicted set of signal values to one or more expected signal values for debugging the integrated circuit.
A non-transitory program storage device comprising instructions stored thereon to cause one or more processors to:
- obtain input signal values and output signal values from an integrated circuit;
- provide the obtained input signal values and output signal values to a machine learning model;
- obtain, from the machine learning model, a predicted set of signal values, wherein the predicted set of signal values correspond to signals internal to the integrated circuit;
- compare the predicted set of signal values to one or more expected signal values for debugging the integrated circuit.
A system for debugging an integrated circuit, comprising:
- a memory;
- and
- one or more processors operatively coupled to the memory, wherein the one or more processors are configured to execute instructions causing the one or more processors to:
- obtain input signal values and output signal values from an integrated circuit;
- provide the obtained input signal values and output signal values to a machine learning model;
- obtain, from the machine learning model, a predicted set of signal values, wherein the predicted set of signal values correspond to signals internal to the integrated circuit;
- compare the predicted set of signal values to one or more expected signal values for debugging the integrated circuit.
Dependencies are inferred from the claim text.