Test board and test device including the same

A test board comprising:

• a first region in which first test sockets are aligned;
• a second region in which second test sockets are aligned;
• a hinge portion between the first region and the second region, configured to change an angle between the first region and the second region, and configured to connect the first region and the second region;
• a first connector at one end of the first region opposite to the hinge portion;
• and
• a second connector at one end of the second region opposite to the hinge portion,
• wherein the angle between the first region and the second region is 0 degree or more and 180 degrees or less,
• the first connector is selectively connected to the second test sockets, and
• the second connector is selectively connected to the first test sockets.

A test device comprising:

• a main body which includes a chamber configured to test a plurality of test target devices;
• and
• a test board configured to support the plurality of test target devices and mounted inside the chamber,
• wherein the test board includes
• a first region in which first test sockets connected to the test target devices are aligned,
• a second region in which second test sockets connected to the test target devices are aligned,
• a hinge portion between the first region and the second region, and configured to connect the first region and the second region such that the first region and the second region are folded or unfolded,
• a first connector at one end of the first region opposite to the hinge portion, and
• a second connector at one end of the second region opposite to the hinge portion.